Professional Documents
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EXAMINATION(A)
Owner / CUSTOMER
MANUFACTURER./CONTRACTOR
REPORT No.
SCOP
HDGSK-JV
IONE-QA-A-RT-APN-WQT-0003
PROJECT NAME.
DATE OF REPORTING
PAGE N
IONE
23-Jan-16
1 of 2
APPLICABLE(ACCEPTANCE) STANDARD
IONE-AA00-PE-QA-0022 / Rev 0
ASME Sec IX
MATERIALS.
IONE-IN-A-TK-WN-0001(NFWQT-0001)
A283-C
BASIC MATETIAL
THICHNESS
16
mm
WELDING PROCESS.
GTAW
SAW
GMAW
X-ray
VOLTAGE.
250
-Ray
SOURCE TYPE
FILM
Single-Image
ASTM
FCAW
CURRENT.
10
STRENGTH.
BRAND.
TYPE.
Agfa
D7
FILM VIEWING.
I.Q.I No.
SMAW
KVP
MATERIALS FORM
FILM DENSITY
Double-Wall
1.8 ~ 4.0
2.0
3 mm
SOURCE SIZE:
I.Q.I PLACEMENT
%
Source-Side
EXPOSURE TIME.
Min
EXPOSURE TIME.
FFD(SFD)
700
TYPE.
mm
Min
As Welded
THICKNES
SCREEN
Pb
SURFACE CONDITION
As Ground
Basic Material
Welding
Sensitivity
1B
0.03
DEVELOPING CONDITION.
Manual
Total
Auto
20
Sheet
Remarks
Source Side
CONSTRUCTION
ASNT Level-III
Bong Seok Cho
SIGNATURE
DATE
RT-001-A(Rev.0)
23-Jan-16
Film Side
HDGSK JV QA/QC
EMPLOYER
12
REPORT OF RADIOGRAPHIC
EXAMINATION(A)
IONE-QA-A-RT-APN-WQT-0003
Report No.
A P N I I C
22-Jan-16
DATE of TEST
Position
Joint
No.
Size
(Inch)
Thickn
ess
(mm)
Welding
Process
NAME
SIGNATURE
Result
Rej
Acc
Interpreta
tion
Request
No.
2G
16mm
FCAW
A-TK-WN-0001
"
3G
"
"
"
Nazmul Hossain
2G
16mm
FCAW
A-TK-WN-0001
"
3G
"
"
Sadekul Islam
2G
16mm
FCAW
"
3G
"
"
Babul Mondol
2G
16mm
FCAW
A-TK-WN-0001
"
3G
"
"
"
Moazzem Hossain
2G
16mm
FCAW
A-TK-WN-0001
"
3G
"
"
UC
"
Juwel Rana
2G
16mm
FCAW
UC
A-TK-WN-0001
"
3G
"
"
PO
"
DEFECT
CODE
POSITION
Location
Abu Hanif
--------
KIND
of
PAGE No
UC
"
A-TK-WN-0001
PO
"
BLANK -------
ND : No Defect
CR : Crack
IP : Incomplete Penetration
SD : Surface Defect
SI : Slag
PO : Porosity
WP :
CP : Cluster Porosity
BT : Burn Through
M : Mismatch
ID : Internal Debris
CONSTRUCTION
ASNT Level-III
Bong Seok Cho
Worrm Hole(Porosity)
Inclusion
HDGSK JV QA/QC
LF : Lack of Fusion
TI : Tungsten Inclusion
EMPLOYER
DATE
RT-001-A(Rev.0)
23-Jan-16
REPORT No.
IONE-QA-A-RT-APN-WQT-0003
PAGE No.
1 of 2
APPLICABLE(ACCEPTANCE) STANDARD
ASME Sec IX
MATERIALS FORM
Basic Material
I.Q.I PLACEMENT
Source-Side
Film-Side
Min
00
Min
Sec
Sec
THICKNESS.
0.03 mm
DEVELOPING CONDITION.
12
Remarks
EMPLOYER
Min
SH'T
IONE-QA-A-RT-APN-WQT-0003
22-Jan-16
of
Request
No.
2
Remark
A-TK-WN-0001
"
A-TK-WN-0001
"
A-TK-WN-0001
"
A-TK-WN-0001
"
A-TK-WN-0001
"
A-TK-WN-0001
"
LF : Lack of Fusion
TI : Tungsten Inclusion
R/EP : Root Excess Penetration
M : Mismatch
S/M : Screen Mark
EMPLOYER