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CICC 2009
Michael H. Perrott September 2009
Performance is important
- Phase noise can limit wireless transceiver performance - Jitter can be a problem for digital processors - Analog building blocks on a mostly digital chip pose design and verification challenges - The cost of implementation is becoming too high
Can digital phase-locked loops offer excellent performance with a lower cost of implementation?
M.H. Perrott
Phase Detect
VCO efficiently provides oscillating waveform with variable frequency PLL synchronizes VCO frequency to input reference frequency through feedback
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ref(t)
Phase Detect
out(t)
Quantization Noise
f
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phase error
ref(t)
error(t)
ref(t)
out(t)
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Pulse width is formed according to phase difference between two signals Average of pulsed waveform is applied to VCO input
Average of error(t)
Phase Detect div(t) Analog Loop Filter Divider
phase error
ref(t)
out(t)
VCO
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Benefit: average of pulsed output is a continuous, linear function of phase error Issue: analog loop filter implementation is undesirable
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error(t)
Charge Pump
ref(t)
Phase Detect
out(t)
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Charge pump: output resistance, mismatch Filter caps: leakage current, large area
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Going Digital
ref(t) Phase Detect Analog Loop Filter VCO Divider out(t)
ref(t)
Time -toDigital
out(t)
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Outline of Talk
Overview of Key Blocks (TDC and DCO) Modeling & CAD Tools High Performance TDC design Quantization Noise Cancellation DCO based on an efficient passive DAC structure Divider Design Loop Filter Design Prototype with measured Results
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div(t)
D Q Reg D Q Reg D Q Reg
e[k] ref(t)
1 1 1 0 0
e[k]
ref(t)
ref(t)
out(t)
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div(t)
1 1 1 0 0
e[k]
detector output
phase error out(t) DCO
ref(t)
ref(t)
Integer-N PLL
- Limit cycles due to limited resolution (unless high ref noise) - Fractional spurs due to non-linearity from delay mismatch
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Fractional-N PLL
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Modeling of TDC
Phase Detector Characteristic quantization error tq[k] tdel time error phase error[k] T 2 TDC Gain 1 tdel e[k]
detector output
out(t)
Phase error converted to time error by scale factor: TDC introduces quantization error: tq[k] TDC gain set by average delay per step: tdel M.H. Perrott
T/2
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Analog Control
Varactor
Varactor
DAC
ref(t)
out(t)
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- Allows the use of an existing VCO within a digital PLL - Can be applied across a broad range of IC processes
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ref(t)
Varactor
Time -toDigital div(t)
Varactor
Digital Loop Filter DCO Divider
Digital Control
out(t)
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Coarse Control
Varactor
Varactor
Fine Control
- Binary array: efficient control, but may lack monotonicity - Unit element array: monotonic, but complex control
- Coarse control: active only during initial frequency tuning (leverage binary array) - Fine control: controlled by PLL feedback (leverage unit
element array to guarantee monotonicity)
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out(t)
Coarse Initial Control Frequency
T ref(t)
Varactor
Divide-by-K
T c=T/M
Varactor
Tuning
Fine Control
Digital Modulator
DCO
TDC out
Increase resolution by dithering of fine cap array Reduce noise from dithering by
- Using small unit caps in the fine cap array - Increasing the dithering frequency (defined as 1/T )
c
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Varactor
Varactor
Digital Control
Phase noise
- Same as for
Quantization Noise
Phase Noise
f M
f out(t)
- See Section 3
in[k]
of Supplemental Slides
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Modeling
-20 dB/dec
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TDC and DCO-referred noise influence overall phase noise according to associated transfer functions to output Calculations involve both discrete and continuous time
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TDC-referred noise
DCO-referred noise
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TDC-referred noise
DCO-referred noise
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Key Observations
tq[k] ref[k] div[k] 1 N T 2 TDC Gain 1 tdel Loop Filter e[k] H(z) z=ej2fT CT-DT 1 T T DT-CT 2Kv s s=j2f n(t) out(t)
TDC-referred noise
Lowpass with a DC gain of 2N
DCO-referred noise
Highpass with a high frequency gain of 1 How do we calculate the output phase noise?
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H(ej2fT)
y(t)
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CT DT DT
CT DT CT
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TDC noise
-20 dB/dec
DCO noise
out(t)
2 1 2N G(f) S tq(e j2fT) T
fo
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S tq(e j2fT)
tdel 12 f tq[k]
fo
2N G(f)
2 2 tdel
1 2N G(f) T f
12
fo
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CAD Tools
A(f) =
G(f) 1-G(f)
- Indirectly design G(f) using bode plots of A(f) - Directly design G(f) by examining impact of its specifications on phase noise (and settling time) - Solve for A(f) that will achieve desired G(f)
Implemented in PLL Design Assistant Software
http://www.cppsim.com
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- G(f): 500 kHz BW, Type II, 2 order rolloff - TDC noise: -94.7 dBc/Hz - DCO noise: -153 dBc/Hz at 20 MHz offset (3.6 GHz carrier)
nd
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L(f) (dBc/Hz)
DCO Noise
10
10
10
TDC noise too high for GSM mask with 500 kHz PLL bandwidth
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- G(f): 100 kHz BW, Type = 2, 2 order rolloff - TDC noise: -94.7 dBc/Hz - DCO noise: -153 dBc/Hz at 20 MHz offset (3.6 GHz carrier)
nd
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L(f) (dBc/Hz)
-100 -110
DCO Noise
-120 -130 -140 -150 -160 3 10 10
4
10
10
10
- Where:
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Assumptions
del
- Ref freq (1/T) = 50 MHz, Out freq = 3.6 GHz (so N = 72) - t = 20 ps, K = 12 kHz/unit cap - 100 kHz bandwidth, Type = 2 , 2 order rolloff
v nd
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D Q R
Schematic
- Hierarchical
R D Q
PFD
Charge Pump
Loop Filter
Code blocks
of module behavior using templated C++ code
- Specification
Divider Modulator
CppSim Module Description Name Inputs, Outputs Parameters Code
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http://www.cppsim.com
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Motivation
TDC-referred Noise S tq(e j2fT) f tq[k] fo 2N G(f) fo DCO-referred Noise S n(f) f n(t) 1-G(f)
-20 dB/dec
PLL bandwidth dramatically influences relative impact of TDC and VCO noise
Want high PLL bandwidth? Need low TDC Noise
dBc/Hz
TDC Noise
dBc/Hz f
DCO Noise
fo
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fo
f
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div(t)
D Q Reg D Q Reg D Q Reg
e[k] ref(t)
Delay
1 1 1 0 0
e[k]
ref(t)
Vernier
div(t)
Delay Delay Delay
div(t)
D Q Reg
D Q Reg
D Q Reg
1 1 1 0 0
e[k]
ref(t)
ref(t)
Delay2
Delay2
Delay2
e[k]
Delay2
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Mismatch issues are more severe than the single delay chain TDC
div(t)
D Q Reg
D Q Reg
D Q Reg
1 1 1 0 0
e[k]
ref(t)
ref(t)
Delay2
Delay2
Delay2
e[k]
Delay2
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div(t)
Fine e[k]
Delay - Delay2
Single delay chain provides coarse resolution (Folded) Vernier provides fine resolution
Delay
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div(t)
Delay
Delay
Delay
Fine e[k]
Single delay chain provides coarse and fine resolution Time amplification is used to improve resolution
Delay
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out(t) tin
Simplified view of: Abas, et al., Electronic Letters, Nov 2002 (note that actual implementation uses SR latch)
Metastability leads to progressively slower output transitions as setup time on latch is encroached upon
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Start
1 1 1 1 Out
Start
Stop
Registers
Tstop
1 1 0
Out
Stop Tin
Interpolate between edges to achieve fine resolution Cyclic approach can also be used for large range
48
M.H. Perrott
An Oscillator-Based TDC
Phase Error[1] Vdd Ring Oscillator div(t) ref(t) Osc(t) Reset ref(t) Logic div(t) Counter Count[k] Register e[k] e[k] Count[k] Phase Error[2]
Output e[k] corresponds to the number of oscillator edges that occur during the measurement time window Advantages
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- Extremely large range can be achieved with compact area - Quantization noise is scrambled across measurements
49
Quantization error occurs at beginning and end of each measurement interval As a rough approximation, assume error is uncorrelated between measurements
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Deterministic TDC do not provide inherent scrambling For oversampling benefit, TDC error must be scrambled! Some systems provide input scrambling ( fractional-N PLL), while some others do not (integer-N PLL)
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- Hold the state of the oscillator between measurements - e[k] = Phase Error[k] + q[k] q[k-1] - Averaging dramatically improves resolution!
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Osc. Phases(t)
11
10
Raw resolution is set by inverter delay Effective resolution is dramatically improved by averaging M.H. Perrott
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Measurement 1
Enable
Measurement 2
Enable
Measurement 3
Enable
Measurement 4
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(a)
Enable
(b)
Delay Element
Enable
Gate the oscillator by switching the inverter cores to the power supply
Vo n-1 Vo 5 Vo 4 Vo 3 Vo 2 Vo n Vo 1
Enable
M4 M3
Vo i-1
M2 M1
Vo i
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GRO Prototype
enable 15 Stage Gated Ring Oscillator En Dis
S Q R
enable(t) enable
Straayer, Perrott
Logic
error[k]
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enable(t) enable
40
30
20
Logic
error[k]
Amplitude (dB)
10
-10
-20
-30 0.01
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Frequency (MHz)
10
100
58
Deadzones were caused by errors in gating the oscillator GRO injection locked to an integer ratio of FS Behavior occurred for almost all integer boundaries, and some fractional values as well Noise shaping benefit was limited by this gating error
59
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Use multiple inputs for each delay element instead of one Allow each stage to optimally begin its transition based on information from the entire GRO phase state Key design issue is to ensure primary mode of oscillation
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Oscillation frequency near 2GHz with 47 stages Reduces effective delay per stage by a factor of 5-6! Represents a factor of 2-3 improvement compared to previous multi-path oscillators
62
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2 counters per stage * 47 stages = 94 counters each at 2GHz Power consumption for these counters is unreasonable Need a more efficient way to measure the multi-path GRO
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- A single counter for coarse phase information (keeps track of phase wrapping) - GRO phase state for fine count information
64
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Multi-path structure leads to ambiguity in edge position Partition into 7 cells to avoid such ambiguity Requires 7 counters rather than 1, but power still OK
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CLK
Adder
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279.0
278.8
-100
1.2ps
278.6 0 40 80 120 160 200
104
105
106
107
Frequency (Hz)
Time (s)
(a)
(b)
Data collected at 50Msps More than 20dB of noise-shaping benefit 80fsrms integrated error from 2kHz-1MHz Floor primarily limited by 1/f noise (up to 0.5-1MHz)
67
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- 94, 188, 282, etc. - No deadzones for other even or odd integers, fractional output
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Loop Filter
Out
Fout
PLL dynamics
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Phase error due to is predicted by accumulating quantization error Gain matching between PFD and D/A must be precise
Scale factor determined by simple digital correlation Analog non-idealities such as DC offset are completely eliminated
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See analog version of this technique in Swaminathan et.al., ISSCC 2007 M.H. Perrott
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Gated-ring-oscillator (GRO) TDC achieves low in-band noise All-digital quantization noise cancellation achieves low out-of-band noise Design goals:
- 3.6-GHz carrier, 500-kHz bandwidth - <-100dBc/Hz in-band, <-150 dBc/Hz at 20 MHz offset
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Dual-Port LC VCO
Frequency tuning:
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- Use a small 1X varactor to minimize noise sensitivity - Use another 16X varactor to provide moderate range - Use a four-bit capacitor array to achieve 3.3-4.1 GHz range
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Goals of 10-bit DAC
1X varactor minimizes noise sensitivity 16X varactor provides moderate range A four-bit capacitor array covers 3.3-4.1GHz
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- Monotonic - Minimal active circuitry and no transistor bias currents - Full-supply output range
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- Resistor ladder forms V = M/32V and V = (M+1)/32V , where M ranges from 0 to 31 - N unit capacitors charged to V , and (32-N) unit capacitors
DD
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charged to VL
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Issues:
GRO range must span entire reference period during initial lock-in
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Vc(t) varies Vf(t) is held at midpoint Vc(t) is frozen to take quantization noise away quantization noise cancellation is enabled
83
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Set zero (62.5kHz) and first pole (1.1MHz) digitally Set second pole (3.1MHz) by capacitor ratio
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ref[k] div[k]
T 2
TDC Loop Gain Filter e[k] 1 H(z) tdel z=ej2fT divider 1 Nnom
DAC Gain V 2B
DT-CT T
out(t)
CT-DT 1 T
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DAC thermal noise impacts performance due to the higher coarse VCO gain
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Bypass to divider for feedforward path allows coarse DAC bandwidth to be dramatically reduced!
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T 2
Routing of signal path into Sigma-Delta controlling the divider yields a feedforward path
- Adds to accumulator path as both signals pass back through the divider - Allows reduction of coarse DAC bandwidth
Noise impact of coarse DAC on VCO is substantially lowered
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0.13-m CMOS Active area: 0.95 mm2 Chip area: 1.96 mm2 VDD: 1.5V Current:
GRO-TDC:
2.3mA 157X252 um2
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DAC
VCO
21.0mW (46%)
Digital
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Notice GRO and digital quantization noise cancellation have only minor impact on power (and area)
90
Suppresses quantization noise by more than 15 dB Achieves 204 fs (0.27 degree) integrated noise (jitter) Reference spur: -65dBc
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60
80
dBc/Hz
100
120
140
160
180 3 10
10
10
10 foffset
10
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16.2us
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Conclusions
Behavioral simulation tools such as CppSim allow architectural investigation and validation of calculations TDC structures are an exciting research area
Supplemental Slides
Section 1: Digital Fractional-N Frequency Synthesizers
ref(t)
Time e[k] Digital -toLoop Filter Digital div(t) N[k] DCO Divider
out(t)
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ref(t)
Wrap e[k] by feeding delay chain in TDC with out(t) Counter provides information of when wrapping occurs
97
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Key Issues
ref(t) e[k] Time Phase Reg -toUnwrap Digital Reg Re-time ref(t) signal cnt[k] div(t) Reg Digital Loop Filter DCO count reset out(t)
Counter, re-timing register, and delay stages of TDC must operate at very high speeds
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ref(t)
Time e[k] Digital -toLoop Filter Digital div(t) DCO Divider N[k]
out(t)
4.25
Accum
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Accumulator residue corresponds to an estimate of the instantaneous phase error of the PLL
- Fractional value (i.e., 0.25) yields the slope of the residue - Carry out signal accurately predicts when a VCO cycle
should be swallowed
ref(t) Time e[k] Digital -toLoop Filter Digital div(t) DCO Divider Carry Out Residue Carry Out out(t)
Carry out signal is asserted when the phase error deviation (i.e. residue) exceeds one VCO cycle
N.Frac = 4.25
Accum
Frac =0.25
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- Dramatic reduction of spurious noise - Noise shaping for improved in-band noise - Maintains bounded phase error signal
ref(t) Time e[k] Digital -toLoop Filter Digital div(t) DCO Divider N[k]
Nsd[k]
Modulator
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-20 dB/dec
DT-CT T
CT-DT 1 T
Divider model is expanded to include the impact of divide value variations M.H. Perrott
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f tq[k] 2NnomG(f) fo
f n(t) 1-G(f)
- High PLL
T G(f) fo out(t)
z=ej2fT
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Supplemental Slides
Section 2: DCO Modeling
out(t)
Coarse Initial Control Frequency
T ref(t)
Varactor
Divide-by-K
T c=T/M
Varactor
Tuning
Fine Control
Digital Modulator
DCO
TDC out
Increase resolution by dithering of fine cap array Reduce noise from dithering by
- Using small unit caps in the fine cap array - Increasing the dithering frequency (defined as 1/T )
c
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incap(t) t Kv
in[k]
insd[m]
inq[m]
incap(t)
m Tc
t Tc
- Clocked at 1/T (i.e., reference frequency) - Clocked at 1/T = M/T - Held at a given setting for duration T
c c
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- Units of K
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incap(t) t Kv
Zero-Order Hold
Tc
0 1/Tc
z=ej2fTc
Upsampler and zero-order hold correspond to discrete and continuous-time sinc functions, respectively has signal and noise transfer functions (Hstf(z), Hntf(z))
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- Note: var(q
raw[k])
Tc
Hntf(z)
Zero-Order Hold
Tc
Hstf(z)
0 1/Tc
z=ej2fTc
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Assume Hstf(z) = 1
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q[k]
Proper design of DCO will yield quantization noise that is below that of the intrinsic phase noise (set by tank Q, etc.)
f out(t)
DT-CT in[k] T
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Supplemental Slides
Section 3: Derivation of VCO Quantization Noise Due to Capacitor Dithering
q[k]
DT to CT spectral calculation:
-S -H
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qraw(f)
= 1/12 since qraw[k] uniformly distributed from 0 to 1 -1 -1 2 ntf(z) is often 1-z (first order) or (1-z ) (second order)
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- Dithering frequency is 200 MHz (i.e., 1/T = 200e6) - has first order shaping (i.e., H (z) = 1 - z ) - Fine cap array yields 12 kHz/unit cap (i.e., K = 12e3)
c ntf -1 v
Supplemental Slides
Section 4: Derivation of Discrete-Time Loop Filter Parameterization based on Continuous-Time Specifications
PLL Design Assistant assumes continuous-time open loop transfer function Acalc(s):
Above parameters are calculated based on the desired closed loop PLL bandwidth, type, and order of rolloff (which specify G(s)) For 100 kHz bandwidth, type = 2, 2nd order rolloff, we have:
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At low frequencies (i.e., |sT| << 1), we can use the first order term of a Taylor series expansion to approximate
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Given the continuous-time approximation of A(s), we then leverage the PLL Design Assistant calculation:
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- Where:
Note: Tdco= T/N