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Table 19-02-IV
31 To simulate interference generated for instance, by switching on or off high-power inductive consumers. The test is to be carried out at the power supply system of the test specimen. -2 Testing conditions
- Test voltage: 1,0 k for differential mode and !,0 k for common mode
" "
R+se t+*e1 122 #3s2 #urge time $%0 & value': %0 u,s
- Test duration: not less than 3 minutes for positive pulse and not less than 3 minutes for negative pulse " (epetition rate: ) pulse*min. 33 +s a result of the test neither permanent or transient effects nor damage to the e,uipment are allowed.
- interference effect occuring on the power supply, as well as at the e.ternal wiring of the test specimen. 1! Testing conditions
- test voltage / 10&: " ! k on power supply " 1 k on 0*1 signal data and control lines 13 +s a result of the test neither permanent or transient effects nor damage to the e,uipment are allowed.
41 To simulate distortions in the power supply system generated for instance, by high-power electronic consumers and coupled in as harmonics. 42
Testing conditions
Test voltage: (2# 10& of supply voltage up to the 1%th harmonic of supply fre,uency, reducing to 1 & at the 100th harmonic and maintained at this level to the !00th harmonic.
"
Testing signal 1,0 (2# in the range between 10 k34 and %0 234:
"
2odulation: 30&,
53 +s a result of the test neither permanent or transient effects nor damage to the e,uipment are allowed.
when persons touch the appliance, the test is to be confined to the points and surfaces that can normally be reached by the operator.
44
Testing conditions
6 the e,uipment is to operate during testing - test voltage: 7 k according to level 3 severity standard
43
!3 +s a result of the test neither permanent or transient effects nor damage to the e,uipment are allowed.
%3 +s a result of the test neither permanent or transient effects nor damage to the e,uipment are allowed.
1 st *ar)8 1996
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