Professional Documents
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( )
2
2
3
2
2
3 F
F 3
I
oc
oc
o
o
oc oc oc
(
W
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No#, "o and /o can +e directl% computed in M"T9"E
using onl% e.)2* step, +ecause t$e e.uation in simple 2*2
matri- form.
B "eduction of #pen Circuit Test $%uation
If t$e e.ui&alent parameters of t$e po#er transformer "o,
and /o, e-pressed in matri- form as gi&en +elo#
F3
2
2 2
F2
F3
3 F 3 F
F 3 F 3
0
0 0
o0
sc 0
0
sc sc
-0
1 1 1
1
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" * k
W * k )
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( W
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/ 3
k k )
k
= =
)8*
T$en 5C Test related e.uation )8* can +e reduced as
gi&en +elo#
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F3
3 F
F 3
0 0
sc 0
1 0 0
sc
1 1
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W * k )
"
) (sc W
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)0*
No#, "o, and /o, can +e directl% computed in M"T9"E
using onl% e. )0* step, +ecause t$e e.uation in simple 2*2
matri- form. T$ese passi&e parameters are not useful to
compute regulation of &oltage, +ut also to ,no# t$e status
of t$e failure of po#er transformer. T$is stud% aut$or #ould
li,e to e-tend in future #or,.
>III. RE5!9T5 "N I5C!55ION5
"fter t$oroug$ re&ie# of failure stud% of <o#er
Transformer, it is o+ser&ed t$at ": on line is found useful,
+ut it is re.uired more training and s,illed programs are
essential to de&elop e-pert rules for "NN<E5. T$e :"
anal%sis on Oil results can +e considered as indirect anal%sis,
+ecause #e are deciding t$e nature of core life or current
carr%ing #inding life +ased on c$emical status23-14. T$e
Ta+le II results are +ased on c$emical engineering anal%sis
+ased output confirms t$e failure #it$ reference to
ma-imum &alue 3)failure confirmed* and minimum &alue
)failure not confirmed*. =or e-ample' :" report on oil t$e
lo# energ% disc$arge 29E4)F.FF1, F.F3F* and /ig$ Energ%
isc$arge2/E4)3.FFF,F.HHF* from +ot$ "NN and <E5,
respecti&el% and compara+le t$e same. Eut t$ese test results
are more dependent on c$emical +onding oil.
=rom t$e Ta+le I> and Ta+le >, it is o+ser&ed t$at t$e
failure results are confirmed +ased on an electrical passi&e
parameter conditions le&el identification test. T$ere are' i*
Resistance Test( ii* Capacitance test, decreasing t$e &alue of
#inding resistance from its reference. T$is particular test
can +e treated as direct test 2334. =or e-ample <$ase E
#inding &alue is F.82H1, #$ic$ is less t$an e-pected &alue.
5imilarl%, from Ta+le it is found t$at t$e cause of co-a-ial
#inding collapse is confirmed t$roug$ #inding capacitance
i.e. lesser t$e &alue of capacitance t$en more se&ere a+out
t$e collapse. =rom t$is #e can o+ser&e t$at, magnetising
component /o and core component "o )core resistance* and
Transformer #inding parameters computing t$roug$ Open
Circuit and 5$ort Circuit pla%s an significant role,
+efore and after t$e age. One more indirect test can +e
seen in literature a+out furfuralde$%de anal%sis. It is
&er% sensiti&e as +ecause damage of fe# grams of
paper is noticea+le in t$e oil e&en of a &er% large si@e
transformer. In t$is anal%sis also #e can sa% t$at
insulating paper dielectric support-stud% for t$e
#inding, +ut actual stud% needs to ,no# t$e status of
transformer, #$ic$ $as components are core and
#indings.
IN. CONC9!5ION5
=ault and failure in&estigations on po#er
transformer components $a&e an important role in
impro&ing relia+ilit% are ena+le recommendations for
correcti&e action to +e made t$at $opefull% #ill
pre&ent similar failures from occurring in t$e future.
=ailures also $appen +ecause of maintenance
o&ersig$ts and o&er loadings. Ano# Dour <o#er
Transformer Components functions #it$ t$eir a+ilit%,
can pre&ent recurrences. 6$en design error andCor
#ea,nesses de&eloping o&er time are unco&ered,
en$anced monitoringCin&estigation on similar units
+uilt +% same manufacturer #ill $elp in pre&enting
future failures i.e. practice can leads to a&oid
une-pected failure. T$e computation and anal%sis of
core and #inding parameter ma% gi&e more direct
prediction of failure of transformer and also reduction
of e.uations in s$ort circuit and open circuit tests ma%
$elp in future #or, to identification of failure in
po#er transformer.
.
RE=ERENCE5
234 D. O$ang, N. ing, D. 9iu, <. P. :riffin Q"n "rtificial Neural
Net#or, "pproac$ to Transformer =ault iagnosisR, IEEE
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3?81-3?03.
224 O$en%uan 6ang, Dilu 9iu, <.P. :riffin, Q" Com+ined "NN
and E-pert 5%stem Tool for Transformer =ault iagnosisR,
IEEE Transactions on <o#er eli&er%, >ol.38, No.0, Oct.
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284 O$en%uan 6ang, Q"rtificial Intelligence "pplications in t$e
iagnosis of <o#er Transformer Incipient =aultsR, <$..
dissertation, "ug. 2FFF.
204 eepi,a E$alla, RaI,umar Eansal and /ari Om :upta
-Transformer incipient fault diagnosis +ased :" using
fu@@% logicR IEEE-International Conference on <o#er
Electronic IIC<E*, 2F3F.
2;4 eepi,a E$alla, RaI,umar Eansal and /ari Om :upta,
Q<re&enting <o#er Transformer =ailures t$roug$ Electrical
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214 R. /e%#ood, P. 9ap#ort$, 9. /all, and O.
Ric$ardson, QTransformer lifetime performance' Managing
t$e ris,sR, 8
rd
IEE International Conference on Relia+ilit% of
Transmission and istri+ution Net#or,s, 9ondon( =e+ 2FF;.
2J4 ". 6ilson, R. /e%#ood and O. Ric$ardson, QT$e life
time of po#er transformersR, Insucon 2FF1, 20-21 Ma% 2FF1,
Eirming$am, !A.
2?4 /. ing and 5. R%der, Q6$en to replace aged transformersS
E-periences from forensic tear do#ns and researc$R, Euro
Tec$Con 2FF?. 9i&erpool, 3?-2F No&em+er 2FF?.
2H4 CI:RT 6or,ing :roup 32.3?, Q:uide for life
management tec$ni.ues for po#er transformersR, CI:RT
Eroc$ure No. 22J, 2F Panuar% 2FF8.
23F4 CI:RE 6: 32.3? Q9ife management of transformers, draft
interim reportR, Pul% 3HHH.
;
2334 /. O$i, Ric$ard /a%#ood, Pon$ 9ap#ort$, 5.R%der, Q6$%
Transformer =ailR, Euro Tec$Con,!.A, pp. 3-3
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