Progress In Electromagnetics Research Symposium Proceedings, Moscow, Russia, August 1923, 2012 1121

Investigation of Defect Modes on One-dimensional Ternary

Metallic-dielectric Nano Photonic Crystal with Metallic Defect
Layer
Abdolrasoul Gharaati and Hadis Azarshab
Department of Physics, Payame Noor University, Tehran, Iran

Abstract We investigate the characterization of defect mode in one-dimensional ternary

metallic-dielectric photonic crystal structures. The defect layer is made of metallic material. We
consider defect mode for both symmetric and asymmetric geometries. Additionally, we demonstrate reflectance in terms of wavelength and its dependence on different angles of incidence for
both transverse electric (TE) and transverse magnetic (TM) waves. There is just one defect
mode when we use metallic defect layer. All of our calculations have done with transfer matrix
method (TMM) and the Drude model of metals.
1. INTRODUCTION

In recent years, advances in photonic technology have caused so much attention. The simplest possible photonic crystal consists of alternating layers of material with different dielectric constants [1].
A one dimensional ternary metallic-dielectric photonic crystal (1DTMDPC) is a periodic structure
containing dielectric and metallic elements with different index of refraction. 1DPCs because of its
simple fabrication has many applications such as multilayers coatings [2], narrow band filters, and
so on. A range of frequency in which light cannot propagate through the PC is called photonic
band gaps (PBG). We have used TMM to calculate the transmitted and reflected coefficients of
incident electromagnetic waves.
In this paper, using TMM, we calculate the defect mode wavelength. We apply this method to
1DPC consisting of periodically dielectric-metal-dielectric with metallic defect layer for both TE
and TM waves.
2. THEORETICAL ANALYSIS

A 1DTMDPC with a structure of A/(n1 n2 n3 )N D(n3 n2 n1 )N /A, for symmetric geometry and A/(n1
n2 n3 )N D(n1 n2 n3 )N /A, for asymmetric geometry, where A and N mean the usual air and the
number of periods, and n1 , n2 and n3 are the refractive indices of dielectric, metal and dielectric
layers, respectively. 1DTMDPC is made of N -period cells immersed in air (nA = 1) in which the
metallic layer 2 is sandwiched by two dielectric layers 1 and 3 in each cell. The Drude model [3] is
invoked to characterize the wavelength dependence of metallic layer. We assume that the temporal
part of the field to be exp(it). So metal permittivity in Drude model is
2 () = 1

p2
2 + i

(1)

where p and are the plasma

frequency and damping coefficient, respectively. Then metal refractive index is given by n2 = 2 . A one layer in Fig. 2 along with the components of the electric
and magnetic fields of the incident, reflected, and transmitted
wave [7].
0 0 , where it is the wave vector in
Using Maxwell
equations
we
have
the
relations
k
=

the air, B = n 0 0 E, p` = n` cos ` , ` = k0 n` d` cos ` , where ` = 1, 2, and 3. So, the electric

fields become: Ei2 = Et1 exp(i` ) and Ei1 = Er2 exp(i` ) and when included in the boundary
conditions, Et1 and Ei1 can be solved in terms of Ea and Bb :
Ei1 =

(p1 Eb + Bb )
exp(i` ),
2p1

Et1 =

(p1 Eb + Bb )
exp(i` ).
2p1

(2)

And finally, substituting the above expressions in the initial fields components and written in matrix
form, we have

i
cos `
sin

E
E
Ea
`
1
1
p
`
= M1
(3)
=
B1
B1
Ba
ip` sin `
cos `

PIERS Proceedings, Moscow, Russia, August 1923, 2012

1122

..

..

..

(a)

N-cells

..

N-cells

(b)

Figure 1: (a) The structure of symmetric 1DTMDPC. (b) The structure of asymmetric 1DTMDPCs.

(a)

(b)

Figure 2: A schematic of one layer of 1DTMDPC.

Each layer of PC has its own transfer matrix and the overall transfer matrix of the system is the
product of individual transfer matrices, so the characteristics matrix M () for a single period is
expressed as [4]

Y
3
1
cos `
sin

M11 M12
`
ip
`
(4)
M () =
=
M21 M22
ip` sin `
cos `
`=1

On the basis of Bloch theorem, the half trace is used to compute the Bloch wave vector [3, 4].

(M11 + M22 )
1 p1 p2
a =
= cos 1 cos 2 cos 3
+
sin 1 sin 2 cos 3
2
2 p2 p1

1 p2 p3
1 p1 p3

+
cos 1 sin 2 sin 3
+
sin 1 cos 2 sin 3
(5)
2 p3 p2
2 p3 p1
Then, the total characteristic matrix of the total PC is given by [4]

MT (N ) =

m11 m12
m21 m22

= M ()N =

M11 M12
M21 M22

N
,

(6)

The reflection coefficient r is given by [7]

r=

(m11 + m12 p0 )p0 (m21 + m22 p0 )

(m11 + m12 p0 )p0 + (m21 + m22 p0 )

(7)

where p0 = n0 cos 0 . We can calculate the reflectance R = |r|2 . The above calculations can be
used for TM wave by substituting p` = cos ` /n` where ` = 0, 1, 2, and 3, respectively. So the
characteristic Matrix of Left and Right unit cells with the number of periods equal N in symmetric

Progress In Electromagnetics Research Symposium Proceedings, Moscow, Russia, August 1923, 2012 1123

and asymmetric geometry is given by [5]

McellL = (M3 M2 M1 )N ,

McellR = (M1 M2 M3 )N
N

McellL = McellR = (M3 M2 M1 )

(8)
(9)

And therefore defect matrix (Mdef ) is given by Eq. (4).

Then the characteristics matrix of entire system is expressed as
Mtot = McellR Mdef McellL

(10)

3. NUMERICAL RESULTS AND DISCUSSION

In this paper, the layers 1 and 3 are ZnSe and Na3 AlF6 which refractive indices and thicknesses
are n1 = 2.6, d1 = 90 nm, n3 = 1.34, d3 = 90 nm, respectively [6]. The metallic layer is taken to be
silver (Ag) with the plasma frequency p = 2 2.1751015 15 rad/s [7], d2 = 10 nm. The thickness
of defect layer is ddef = 10 nm and its index of refraction is calculated with nd ddef = q0 /4, with
a design wavelength of 0 = 1550 nm in infrared region. The number of periods for right and left
cells is equal. The substrate is assumed to be air with nA = 1.
3.1. Defect Modes in 1DSTMDPC with Metallic Defect Layer

In Fig. 3, we plot the reflectance response for symmetric 1DTMDPC (1DSTMDPC) as shown in
Fig. 1, at different angles of incidence at ddef = 10 nm, and N = 5 for TE wave. We see that defect
mode move to the shorter wavelengths with increasing angle of incidence.
We now in Fig. 4 show wavelength-dependant reflectance of 1DSTMDPC with the structure of
(A/(n1 n2 n3 )5 d(n3 n2 n1 )5 /A) for TM-wave. For normal incidence, that is at 0 , there is no difference
between TE and TM waves. We see that resonant peak move to the left (shorter wavelengths) as
the angle of incidence increases. We give the wavelength of the defect modes for different angles of
incidence in TE and TM wave in Table 1.
As we see in Table 1 defect mode move to the shorter wavelengths for TE wave as compared
with TM wave in 1DSTMDPC.
3.2. Defect Modes in 1DATMDPC with Metallic Defect Layer

In Fig. 5, we plot the reflectance response for asymmetric 1DTMDPC (1DATMDPC). We see defect
mode move to the shorter wavelengths with increasing angles of incidence.
We show in Fig. 6 wavelength-dependant reflectance of 1DATMDPC with the structure of
(A/(n1 n2 n3 )5 d(n1 n2 n3 )5 /A) for TM-wave. For normal incidence, that is at 0 , there is no difference
between TE and TM wave. We see that resonant peak move to the left (shorter wavelengths) as

Figure 3: The calculated wavelength-dependant reflectance for the 1DSTMDPC for TE-wave.

Figure 4: The calculated wavelength-dependant reflectance in 1DSTMDPC for TM-wave.

PIERS Proceedings, Moscow, Russia, August 1923, 2012

1124

Figure 5: The calculated wavelength-dependant reflectance for the 1DATMDPC for TE-wave.

Figure 6: The calculated wavelength-dependant reflectance for the 1DATMDPC for TM-wave.
Table 1: The location of defect mode in 1DSTMDPC by changing angle of incidence.
Angels (degree)
0
15
30
45
60
75

Wavelength in TE wave ( nm)

529
521
501
473
446
427

Wavelength in TM wave ( nm)

529
526
519
509
499
490

Table 2: The location of defect mode in 1DATMDPC by changing angles of incidence.

Angels (degree)
0
15
30
45
60
75

Wavelength in TE wave ( nm)

795
790
778
759
740
726

Wavelength in TM wave ( nm)

795
790
774
748
716
690

the angle of incidence increases. We give the wavelength of the defect modes for different angles of
incidence in TE and TM wave in Table 2.
As we see in Table 2 defect mode in 1DATMDPC move to the shorter wavelengths for TM wave
as compared with TE wave.
4. CONCLUSION

In this paper, we have studied properties of defect modes in 1DTMDPC. Defect layer is made of
metallic element with structure A/(n1 n2 n3 )5 d(n3 n2 n1 )5 /A for symmetric geometry and A/(n1 n2
n3 )5 d(n1 n2 n3 )5 /A for asymmetric geometry. As we have shown, there is just one defect mode for
metallic defect layer. Moreover defect modes move to the shorter wavelengths for TE and TM
waves, but, defect mode move to the shorter wavelengths for TE wave in 1DSTMDPC as compared
with TM wave. Also, defect mode move to the shorter wavelengths for TM wave in 1DATMDPC
as compared with TE wave in this structure.

Progress In Electromagnetics Research Symposium Proceedings, Moscow, Russia, August 1923, 2012 1125
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