Professional Documents
Culture Documents
for Manufacturing
Sections:
1. Quality in Design and Manufacturing
2. Traditional and Modern Quality Control
3. Process Variability and Process Capability
4. Statistical Process Control
5. Six Sigma
6. The Six Sigma DMAIC Procedure
7. Taguchi Methods in Quality Engineering
8. ISO 9000
Aspects of Quality:
Product Features
Aspects of Quality:
Freedom from Deficiencies
Absence of defects
Conformance to specifications
Components within tolerance
No missing parts
No early failures
Quality Responsibilities
Product features are the aspect of quality for
which the design department is responsible
Product features determine to a large degree the
price that a company can charge for its products
Acceptance sampling
If the sample passes, the batch is accepted
Overview
Taguchi Design of Experiments
Background of the Taguchi Method
The Taguchi Process
Reduce
Variability
Increase
Quality
Reduce
Cost
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INPUTS
(Factors)
X variables
OUTPUTS
(Responses)
Y variables
People
Materials
PROCESS:
Equipment
responses related
to performing a
service
Policies
responses related
to producing a
produce
Procedures
A Blending of
Inputs which
Generates
Corresponding
Outputs
responses related
to completing a task
Methods
Environment
Illustration of a Process
DOE Course
13
INPUTS
(Factors)
X v ariables
OUTPUTS
(Responses)
Y v ariables
T ype of
cement
compr essive
str ength
Percent water
PROCESS:
T ype of
Additives
Percent
Additives
Mixi ng T i me
modulus of elasticity
Discov ering
Optimal
Concrete
Mixture
modulus of r upture
Poisson's rati o
Curi ng
Conditions
% Plastici zer
DOE Course
14
INPUTS
(Factors)
X v ariables
OUTPUTS
(Responses)
Y v ariables
T ype of Raw
Material
Mold
T emperature
Holdi ng
Pressure
PROCESS:
% shrinkage from
mold size
Holdi ng T ime
Gate Si ze
thickness of molded
part
Manufacturing
Inj ection
Molded Parts
number of defective
parts
Screw Speed
Moisture
Content
DOE Course
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INP UTS
(Factors)
X v ariables
OUTPUTS
(Responses)
Y v ariables
Ini ti al storage
(m m)
PROCESS:
Coeffici ent of
Infil trati on
Coeffici ent of
Recession
Rainfall-Runoff
Model
Calibration
R- square:
Predicted vs
Obser ved Fits
S oil Moisture
Capacity
(m m)
Ini ti al S oi l Moisture
(m m)
Model Calibration
DOE Course
16
INPUTS
(Factors)
X v ariables
OUTPUTS
(Responses)
Y v ariables
Brand:
Cheap vs Costly
PROCESS:
Taste:
Scale of 1 to 10
T ime:
4 min vs 6 mi n
Power:
75% or 100%
Making the
Bes t
Microw ave
popcorn
Bullets:
Grams of unpopped
corns
Height:
On bottom or rai sed
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DOE Course
18
Definition of Terms
23
25
Scrap Cost
LSL
Target
USL
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= The unit repair cost when the deviation from target equals the
maximum tolerance level
Insensitivity to Noise
Noise = Factors which the engineer can not or
chooses not to control
Unit-to-unit
Manufacturing variations
Aging
Corrosion
UV degradation
wear
Environmental
human interface
temperature
humidity
Useful Energy
Energy
Signal Factor, M
Ideal Function of
Product or Process
Quality Characteristic, y
Harmful Energy
Caused by Noise
Control
Factors
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4. Experimentation
Various rigorous analysis approaches like ANOVA and Multiple
Regression can be used but also simpler customized methods are
available
5. Analysis
The experimentation provides best levels for all factors
If interactions between factors are evident Either ignore or run a
full factorial experiment
6. Conforming Experiments
The results should be validated by running experiments with all factors
set to optimal levels
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L4 means the array requires 4 runs. 2^3 indicates that the design
estimates up to three main effects at 2 levels each. The L4 array
can be used to estimate three main effects using four runs
provided that the two factor and three factor interactions can be
ignored.
Orthogonal Array
Design of Experiments: An information gathering exercise.
DOE is a structured method for determining the relationship
between process inputs and process outputs.
Here, our objective is to intelligently
choose the information we gather so that
4) Orthogonal Array
L
(3
9
we can determine the relationship between
Variables
Exp.
the inputs and outputs with the least
X1 X2 X3 X4
Num
amount of effort
L4(23) Orthogonal Array1
1
1
1
1
Number of
Variable Levels
Number of
Variables
L4(23)
Number of
Experiments
Variables
X3
Exp.
Num
X1
X2
Concurrently Addresses
Manufacturing Variation
Concurrent Design-Test
Not Design-Test-Fix
Minimize Development
Time (Stops Fire Fighting)
Corporate Memory
Through Documentation
Encourages Technology
Development Through
System Understanding
THANK YOU
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