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IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS, VOL. 19, NO. 10, OCTOBER 2009
I. INTRODUCTION
NTEGRATED passive device (IPD) technology has garnered significant attention in recent years and has been developed to integrate all kinds of passive devices such as LPF,
band-pass filter (BPF), balun, diplexer, and various matching
blocks [1], [2], [3]. High resistivity silicon (HRS) and GaAs
are used as the substrate to make the IPDs and it is possible
to realize compact and high-performance devices due to thin
film and photolithography processes. Generally, inductors are
the key elements of the IPDs. The Q factors of the inductors
that are realized on HRS or GaAs substrates are in the range of
2030 at 2 GHz [2], [4], [5], and this value is sufficient to design
most IPDs, except BPF, in wireless communication systems.
Because BPFs are designed by using multiple LC resonators to
suppress the harmonics or adjacent noise with a narrow bandwidth, they require higher Q than other IPDs. Over the years,
there have been many publications regarding the improvement
of inductor Q. Suspended structures have been considered as
one of the ways to improve the Q factor of the spiral inductor
[6], [7]. This can increase Q while reducing parallel substrate
capacitance. However, there are complex processes to support
the structures, and their structures are unstable because of the
weakness of the thin membrane.
In this letter, we propose a new suspended inductor using a
thick anodized alumina, and a 2.45 GHz BPF is designed and
fabricated using the inductors. The anodized alumina can support the inductors more robustly than any other membrane, such
as SiO or SiN , and it is easy to realize the air-cavity by using
selective chemical wet-etching.
Manuscript received April 09, 2009; revised June 02, 2009. First published
September 04, 2009; current version published September 23, 2009. This work
was supported by the IT R&D Program, MKE/IITA. [2008-S-013-01, System in
Package (SIP) platform using a selectively anodized aluminum wafer with high
thermal conductivity].
The authors are with the Department of Electrical Engineering, Korea Advanced Institute of Science and Technology, Taejon 305-701, Korea (e-mail:
radio@kaist.ac.kr).
Digital Object Identifier 10.1109/LMWC.2009.2029735
Fig. 1. (a) Schematic of the suspended spiral inductor. (b) Fabrication processes of the suspended inductor.
621
Fig. 3. (a) Circuit diagram of the 2.45 GHz BPF. (b) S21 for various induc.
tances of
= 20
=25
W = 80
= 10
t = 20
= 220
= 10
ID = 380
the inner signal to an outer port. After all metallization processes were complete, porous anodized alumina was selectively
wet-etched. The anodized alumina was well etched vertically
by using buffered oxide etchant (BOE) or oxalic acid due to
its porous structures [10]. It took 45 min to etch the oxide
when the diluted BOE was used. Aluminum could be etched
using diluted hydrochloric acid (HCl) to a depth of 120 m, so
the total depth of the air-cavity was 200 m. The etch rate of
aluminum was 810 m for 1 min. The etching selectivity of
HCl between alumina and aluminum was very high.
Fig. 2(a) and (b) show photographs of the fabricated suspended inductors, and their measurement results are represented
in Fig. 2(c) and (d), respectively. As shown Fig. 2(c), the Q
factor of the suspended spiral inductor is about 25% larger at
2 GHz, and its series inductance was increased from 2.64 to
622
IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS, VOL. 19, NO. 10, OCTOBER 2009
IV. CONCLUSION
We have proposed a suspended inductor using thick anodized
aluminum oxide. This structure is very easy to realize and robust due to the thick dielectric layer. The fabricated inductor
greatly improves the Q factor and inductance compared with
conventional inductors. The suspended single-turn inductor has
a Q factor of 55 at 2 GHz, and a narrow 2.45 GHz BPF can be
designed and fabricated using the inductor. The fabricated BPF
has 2.8 dB of insertion-loss at the pass-band, and its return-loss
is 14 dB. Due to the steep roll-off rate, the BPF has high attenuation at 2.18 GHz, and it has more than 25 dB attenuation at the
PCS (1.81.9 GHz) and CDMA (0.80.9 GHz) band.
ACKNOWLEDGMENT
The authors wish to acknowledge the contribution of the engineers and staff of Wavenics, Inc., KAIST, who greatly supported
this project.
REFERENCES
TABLE I
SUMMARY OF MEASUREMENT RESULTS OF THE SUSPENDED BPF
increment of inductance and the Q factor of , the center frequency of the BPF was moved from 2.75 GHz to 2.45 GHz, and
its IL was improved from 3.4 dB to 2.8 dB. Furthermore, it had
a narrower bandwidth (BW2) than that shown in Fig. 3(b) behad an increment of inductance compared to design.
cause
Table I summarizes the measurement results of the suspended
BPF.
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