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ANSI C63.15-2010

American National Standard


Recommended Practice for
the Immunity Measurement of
Electrical and Electronic Equipment

Accredited Standards Committee C63Electromagnetic Compatibility


accredited by the
American National Standards Institute

Secretariat
Institute of Electrical and Electronic Engineers, Inc.

Approved 5 February 2010


American National Standards Institute

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Abstract: This immunity measurement and measurement instrumentation specification document
complements the recommended procedures for making emission measurements as specified in
ANSI C63.4. The immunity methods are alternative methods that might be of use to
manufacturers who want to ensure a reliable product and reduce customer complaints by adding
some additional immunity into their products beyond that required by law or by correcting
problems experienced in the field not related to regulatory requirements. This document generally
covers the frequency range of 30 Hz to 10 GHz.
Keywords: electromagnetic compatibility, EMC, immunity, RF immunity

________________________

The Institute of Electrical and Electronics Engineers, Inc.


3 Park Avenue, New York, NY 10016-5997, USA

Copyright 2010 by the Institute of Electrical and Electronics Engineers, Inc.


All rights reserved. Published 14 May 2010. Printed in the United States of America.

C63 is a registered trademark in the U.S. Patent & Trademark Office, owned by the Accredited Standards Committee on Electromagnetic
Compatibility.

IEEE is a registered trademark in the U.S. Patent & Trademark Office, owned by the Institute of Electrical and Electronics
Engineers, Incorporated.

PDF: ISBN 978-0-7381-6259-1 STD96065


Print: ISBN 978-0-7381-6260-7 STDPD96065

IEEE prohibits discrimination, harassment and bullying. For more information, visit http://www.ieee.org/web/aboutus/whatis/policies/p9-26.html.
No part of this publication may be reproduced in any form, in an electronic retrieval system or otherwise, without the prior written permission
of the publisher.

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American National Standard
An American National Standard implies a consensus of those substantially concerned with its scope and
provisions. An American National Standard is intended as a guide to aid the manufacturer, the consumer,
and the general public. The existence of an American National Standard does not in any respect preclude
anyone, whether he has approved the standard or not, from manufacturing, marketing, purchasing, or using
products, processes, or procedures not conforming to the standard. American National Standards are
subject to periodic review and users are cautioned to obtain the latest editions.

CAUTION NOTICE: This American National Standard may be revised or withdrawn at any time. The
procedures of the American National Standards Institute require that action be taken to reaffirm, revise, or
withdraw this standard no later than five years from the date of publication. Purchasers of American
National Standards may receive current information on all standards by calling or writing the American
National Standards Institute.
Authorization to photocopy portions of any individual standard for internal or personal use is granted by
the Institute of Electrical and Electronics Engineers, Inc., provided that the appropriate fee is paid to
Copyright Clearance Center. To arrange for payment of licensing fee, please contact Copyright Clearance
Center, Customer Service, 222 Rosewood Drive, Danvers, MA 01923 USA; (978) 750-8400. Permission to
photocopy portions of any individual standard for educational classroom use can also be obtained through
the Copyright Clearance Center.

Errata
Users are encouraged to check the IEEE Errata URL (http://standards.ieee.org/
reading/ieee/updates/errata/index.html), and the one for ASC C63 at http://www.c63.org/
explanations_interpretations_request.htm, for errata periodically.

Interpretations
Current interpretations can be accessed at the following URLs http://www.c63.org/
explanations_interpretations_request.htm.

For more information about the committee that produced and maintains this standard, visit the ANSI
Accredited Standards Committee C63 web site at http://www.c63.org.

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Introduction

This introduction is not part of ANSI C63.15-2010, American National Standard Recommended Practice
for the Immunity Measurement of Electrical and Electronic Equipment.

In the early 1980s, televisions received their signals only over the air because cable and satellite reception
was not available. The tuners had only limited shielding, if any. RF signals from a variety of sources
outside the TV bands interfered with TV reception. In 1982, legislation passed by the U.S. Congress and
President Reagan (Public Law 97-259) giving the FCC the authority to require that home electronics
equipment would have to meet RFI susceptibility standards. This stemmed from the work at the time of
Senator Barry Goldwater and House Representative Charles Vanik. Senator Goldwater was himself an
amateur radio operator and certainly aware of the need for immunity of home electronics especially to
licensed broadcasters using frequencies outside of the TV bands.

At the time, ASC C63 was asked by the FCC to work with the Electronics Industry Association (EIA) to
see if there was a way to add immunity to TVs by the manufacturer so as not to require FCC regulations. A
task force in ASC C63 Subcommittee 1 was set up to address this matter. After extensive discussions, the
TV industry came up with designs that significantly increased the immunity of TVs to out of band signals.
This was one of the first times that the voluntary standards community helped to solve a problem without
the need for regulations.

The above background served to set the stage for the interest in ASC C63 to consider preparing immunity
standard test methods. As such the project was approved in Subcommittee 1 in the 1980s, for an addition to
ANSI C63.4 for measurement methods, and an addition to ANSI C63.2 for measurement instrumentation.
Don Heirman was named as the chairman of the WG on Immunity with the assistance of Ray Magnuson. A
ballot was then taken of the work in 1983. The ballot had many comments but more importantly eight
negative votes. Work then proceeded to resolve the comments. Bill Hayes took over the measurement
instrumentation portion of the task at that time. In parallel there was also major activity in immunity
measurement methods starting in the IEC arena. This required decisions on how to proceed with the work
of ASC C63. The outcome was that the ASC C63 work on immunity was stalled for several years.
However the WG did contribute in this time frame to the military work on commercial off the shelf
(COTS) procurements, as well as immunity text for ANSI C63.12 in the mid-1990s. Further revisions were
made to the C63 draft during this time, headed by Steve Bloom, but at a slow rate because the work in the
IEC was gaining speed. In early 2000, another draft was ready for ballot. The ballot was taken and the
document still failed to get sufficient approval votes. At that time, Herb Mertel assumed the WG
chairmanship working to prepare another draft taking into account the comments that would require
extensive changes to the draft standard. The Subcommittee 1 projects were called project 1-1.1 (Immunity
measurement methods) and project 1-1.3 (Immunity instrumentation) for development of the overall
standard C63.15. By 2003, the projects were combined into one document and given the number C63.15 as
early as 1999. It was identified as a recommended practice. In 2004, Mike Windler took over the task of
editing the document. The ballot again failed in 2005 with substantial negative comments. At that time the
project was shifted to Subcommittee 5 because that subcommittee deals with immunity standards. In 2006,
the last ballot was taken and this time it passed in the parent committee. The final editing was completed in
Fall of 2008, with ANSI and IEEE processing completed for publication in 2010.

The above scenario has been compiled from a variety of documents and sources. It is considered as a
reasonable trail of the activity to publish with this document.

iv
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Notice to users

Laws and regulations


Users of these documents should consult all applicable laws and regulations. Compliance with the
provisions of this standard does not imply compliance to any applicable regulatory requirements.
Implementers of the standard are responsible for observing or referring to the applicable regulatory
requirements. IEEE does not, by the publication of its standards, intend to urge action that is not in
compliance with applicable laws, and these documents may not be construed as doing so.

Copyrights
This document is copyrighted by the IEEE. It is made available for a wide variety of both public and
private uses. These include both use, by reference, in laws and regulations, and use in private self-
regulation, standardization, and the promotion of engineering practices and methods. By making this
document available for use and adoption by public authorities and private users, the IEEE does not waive
any rights in copyright to this document.

Updating of IEEE documents


Users of IEEE standards should be aware that these documents may be superseded at any time by the
issuance of new editions or may be amended from time to time through the issuance of amendments,
corrigenda, or errata. An official IEEE document at any point in time consists of the current edition of the
document together with any amendments, corrigenda, or errata then in effect. In order to determine whether
a given document is the current edition and whether it has been amended through the issuance of
amendments, corrigenda, or errata, visit the IEEE Standards Association web site at
http://ieeexplore.ieee.org/xpl/standards.jsp, or contact the IEEE at the address listed previously.

For more information about the IEEE Standards Association or the IEEE standards development process,
visit the IEEE-SA web site at http://standards.ieee.org.

Errata
Errata, if any, for this and all other standards can be accessed at the following URL:
http://standards.ieee.org/reading/ieee/updates/errata/index.html. Users are encouraged to check this URL
for errata periodically.

Interpretations
Current interpretations can be accessed at the following URL: http://standards.ieee.org/reading/ieee/interp/
index.html.

Patents
Attention is called to the possibility that implementation of this recommended practice may require use of
subject matter covered by patent rights. By publication of this recommended practice, no position is taken
with respect to the existence or validity of any patent rights in connection therewith. The IEEE is not
responsible for identifying Essential Patent Claims for which a license may be required, for conducting
inquiries into the legal validity or scope of Patents Claims or determining whether any licensing terms or
conditions provided in connection with submission of a Letter of Assurance, if any, or in any licensing
agreements are reasonable or non-discriminatory. Users of this recommended practice are expressly
advised that determination of the validity of any patent rights, and the risk of infringement of such rights, is
entirely their own responsibility. Further information may be obtained from the IEEE Standards
Association.

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Participants

At the time this recommended practice was published, the Accredited Standards Committee C63
Electromagnetic Compatibility had the following membership:

Donald N. Heirman, Chair


Daniel Hoolihan, Vice Chair
Jerry Ramie, Secretary
Michael D. Kipness, Secretariat

Organization Represented Name of Representative


AlcatelLucent Technologies ............................................................................................................... Dheena Moongilan
Alliance for Telecommunications Industry Solutions (ATIS)........................................................................ Mel Frerking
..............................................................................................................................................................James Turner (Alt.)
American Council of Independent Laboratories (ACIL) ......................................................................Michael F. Violette
..........................................................................................................................................................William Stumpf (Alt.)
American Radio Relay League (ARRL) .................................................................................................... Edward F. Hare
........................................................................................................................................................... Dennis Bodson (Alt.)
AT&T ......................................................................................................................................................... George Hirvela
.............................................................................................................................................................David Shively (Alt.)
Bureau Veritas .................................................................................................................................................... Jon Curtis
........................................................................................................................................................ Jonathan Stewart (Alt.)
Cisco Systems...........................................................................................................................................Werner Schaefer
Dell Inc. ..................................................................................................................................................... Richard Worley
ETS-Lindgren .......................................................................................................................................... Michael Foegelle
................................................................................................................................................................Zhong Chen (Alt.)
Federal Communications Commission (FCC) ..............................................................................................William Hurst
Food and Drug Administration (FDA)...................................................................................... Jeffrey L. Silberberg (Alt.)
Information Technology Industry Council (ITIC) .......................................................................................... John Hirvela
.......................................................................................................................................................Joshua Rosenberg (Alt.)
Institute of Electrical and Electronics Engineers, Inc. (IEEE) ............................................................. Donald N. Heirman
IEEE-EMCS .......................................................................................................................................... H. Stephen Berger
........................................................................................................................................................ Donald Sweeney (Alt.)
Motorola ........................................................................................................................................................ Tom Knipple
..............................................................................................................................................................Scott Isabelle (Alt.)
National Institute of Standards and Technology (NIST)..............................................................................Dennis Camell
Polycom .......................................................................................................................................................... Jeff Rodman
............................................................................................................................................................ Tony Griffiths (Alt.)
Research in Motion (RIM).............................................................................................................................Paul Cardinal
..............................................................................................................................................................Masud Attayi (Alt.)
Samsung Telecommunications ...................................................................................................................... Tony Riveria
............................................................................................................................................................. Kendra Green (Alt.)
Society of Automotive Engineers (SAE) ..................................................................................................... Poul Andersen
...............................................................................................................................................................Gary Fenical (Alt.)
Sony Ericsson Mobile Communications ........................................................................................................Gerard Hayes
.............................................................................................................................................................. Steve Coston (Alt.)
Telecommuication Certification Body (TCB) Council ..........................................................................................Art Wall
.................................................................................................................................................................Bill Stumpf (Alt.)
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Telecommunications Industry Association (TIA) ...................................................................................Stephen Whitesell
TUV-America, Inc. ............................................................................................................................... David Zimmerman
Underwriters Laboratories .................................................................................................................... Michael J. Windler
.............................................................................................................................................................. Robert Delisi (Alt.)
U.S. Department of DefenseJoint Spectrum Center .............................................................................Marcus Shellman
............................................................................................................................................................ Joseph Snyder (Alt.)
U.S. Department of the NavySPAWAR ............................................................................................ David Southworth
Individual Members.................................................................................................................................. Daniel Hoolihan
.........................................................................................................................................................................John Lichtig
............................................................................................................................................................... Ralph M. Showers
Members Emeritus................................................................................................................................ Warren Kesselman
................................................................................................................................................................ Herbert K. Mertel
.......................................................................................................................................................... H. R. (Bob) Hofmann

During the time this recommended practice was completed, the SC-5 and SC-1 Project Working Groups
had the following membership:

Herbert K. Mertel, Chair


Michael J. Windler*, Technical Editor
Steve Bloom* Richard Gawrelski Walter A. Poggi
Colin Brench Ross Hansen* William T. Rhodes
Edwin L. Bronaugh Tim Harrington (editor) Peter Richman
Joseph Butler E. Heise Dan W. Roth
Al Chiaravallo William K. Hayes* T. Rybak
Dave Cofield Donald N. Heirman* Ralph M. Showers
Mike L. Crawford William Krueger Jeffrey L. Silberberg
Tim DArcangelis* John Lichtig George Sintchak
Glen Dash Ray Magnuson Mike Tedaldi
R. H. Davis Al Parker E. M. Tingley
Donald Friesen Barry Wallen

* Also served as Project Leader during part of the development time.

vii
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Contents
1. Scope .......................................................................................................................................................... 1

2. Normative references.................................................................................................................................. 2

3. Definitions .................................................................................................................................................. 3

4. General requirements.................................................................................................................................. 4

4.1 Safety precautions .................................................................................................................................... 4


4.2 Input power requirements......................................................................................................................... 4
4.3 Measurement tolerances ........................................................................................................................... 4
4.4 Annexes .................................................................................................................................................... 5
4.5 Test reports ............................................................................................................................................... 5

5. Conducted immunity .................................................................................................................................. 5

5.1 CI-1: Power-line immunity, 30 Hz to 150 kHz ........................................................................................ 5


5.2 CI-2: Power-line and signal-line immunity, bulk current injection, 10 kHz to 200 MHz ........................ 6
5.3 CI-3: Communications receiver antenna input immunity (receivers other than broadcast),
30 Hz to 10 GHz .................................................................................................................................. 6
5.4 CI-4: Receiver antenna input immunity for TVs and VCRs, 0.5 MHz to 30 MHz ................................ 10
5.5 CI-5: Power/interconnection line surge voltage ..................................................................................... 10
5.6 CI-6: Electrical fast transient/burst......................................................................................................... 11
5.7 CI-7: Telecommunications terminal equipment line voice band line immunity, 10 kHz to 30 MHz..... 12
5.8 CI-8: Telecommunications telephone terminal equipment, immunity requirements for
equipment having an acoustic output, 150 kHz to 30 MHz ............................................................... 17

6. Radiated immunity ................................................................................................................................... 18

6.1 RI-1: Uniform magnetic field immunity, Helmholtz coil, 30 Hz to 100 kHz......................................... 18
6.2 RI-2: Magnetic field immunity, point source, 30 Hz to 100 kHz ........................................................... 19
6.3 RI-3: Power frequency magnetic induction field.................................................................................... 19
6.4 RI-4: Spikes-inductive field immunity ................................................................................................... 21
6.5 RI-5: Electric field immunity in a TEM cell, 10 kHz to 80 MHz........................................................... 23
6.6 RI-6: Electric field immunity, 80 MHz to 10 GHz................................................................................. 23

Annex A (informative) Immunity testing tutorial......................................................................................... 25

A.1 Basic issues............................................................................................................................................ 25


A.2 Immunity environment .......................................................................................................................... 25
A.3 Immunity trade-offs............................................................................................................................... 26
A.4 Present day radiated immunity test facilities ......................................................................................... 26
A.5 Immunity compliance criteria................................................................................................................ 28
A.6 Other performance degradation concepts .............................................................................................. 31

Annex B (informative) Recommended test equipment for measurement methods where measurement
procedure is in a referenced document .............................................................................................. 32

B.1 Test equipment recommended for method CI-1: power-line immunity................................................. 32

viii
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B.2 Test equipment recommended for method CI-2: power-line and signal-line immunity,
bulk current injection......................................................................................................................... 32
B.3 Test equipment recommended for CI-4: receiver antenna input immunity for TVs and VCRs............. 33
B.4 Test equipment recommended for method CI-5: power-line surge voltage test (IEC 61000-4-5)......... 33
B.5 Test equipment recommended for method CI-6: electrical fast transient test (IEC 61000-4-4) ............ 33
B.6 Test equipment recommended for method CI-8: telecommunications equipment with an
acoustic output, 150 kHz to 30 MHz ................................................................................................. 34
B.7 Test equipment recommended for method RI-1: magnetic field immunity, Helmholtz coil ................. 35
B.8 Test equipment recommended for method RI-2: magnetic field immunity, point source...................... 36
B.9 Test equipment and other considerations recommended for method RI-5: electric field immunity,
10 kHz to 80 MHz (TEM cell method per NBS TN 1013)................................................................ 37
B.10 Test equipment recommended for RI-6: electric field immunity, 80 MHz to 10 GHz
(IEC 61000-4-3)................................................................................................................................ 39

ix
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American National Standard
Recommended Practice for
the Immunity Measurement of
Electrical and Electronic Equipment

IMPORTANT NOTICE: This standard is not intended to ensure safety, security, health, or
environmental protection. Implementers of the standard are responsible for determining appropriate
safety, security, environmental, and health practices or regulatory requirements.

This IEEE document is made available for use subject to important notices and legal disclaimers.
These notices and disclaimers appear in all publications containing this document and may
be found under the heading Important Notice or Important Notices and Disclaimers
Concerning IEEE Documents. They can also be obtained on request from IEEE or viewed at
http://standards.ieee.org/IPR/disclaimers.html.

1. Scope
The conducted immunity (CI) and radiated immunity (RI) test methods in this recommended practice do
not universally apply to every product. Applicable test methods should be selected. A qualified EMC
engineer should document test planning and the rationale for using particular immunity tests. This
document is intended to
a) Identify preferred or optional immunity test methods.
b) Describe specific measurement techniques.
c) Suggest product performance degradation criteria as applicable to general and specific products.
d) Identify test instrumentation specifications.
Wherever possible, existing voluntary standards are utilized and summarized. It should be noted that the
techniques listed herein should in no way limit the user to a particular method to increase product
immunity. The immunity levels in this document are recommended. Should product classifications and type
have other immunity levels that apply, they shall take precedence. Equipment developed for military
applications should use MIL-STD-461E1 or later editions for test procedures and limits.

1
Information on references can be found in Clause 2.

1
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ANSI C63.15-2010
American National Standard Recommended Practice for the Immunity Measurement of Electrical and Electronic
Equipment

2. Normative references
The following referenced documents are indispensable for the application of this document. For dated
references, only the edition cited applies. For undated references, the latest edition of the referenced
document (including any amendments or corrigenda) applies.

ANSI C63.2, American National Standard Specifications for Electromagnetic Noise and Field Strength
Instrumentation, 10 Hz to 40 GHz Specifications.2

ANSI C63.12, American National Standard, Recommended Practice for Electromagnetic Compatibility
Limits.

ANSI C63.14, American National Standard Dictionary of Electromagnetic Compatibility (EMC) including
Electromagnetic Environmental Effects (E3).

ANSI/EIA-544, Immunity of TV and VCR Tuners to Internally Generated Harmonic Interference from
Signals in the Band 535 kHz to 30 MHz. 3

ANSI/TIA-470A, Telephone Instruments with Loop Signaling.

ANSI/TIA-579, Acoustic-To-Digital and Digital-To-Acoustic Transmission Requirements for ISDN


Terminals.

ANSI/TIA/EIA-631, Telecommunications Telephone Terminal Equipment Radio Frequency Immunity


Requirements for Equipment Having an Acoustic Output.

CEA-31, Design GuidelineRejection of Educational Interference to Ch 6 Television Reception.4

EIA Interim Standard No. 16, Immunity of TV Receivers and Video Cassette Recorders (VCRs) to Direct
Radiation from Radio Transmissions, 0.5 to 30 MHz. 5

EIA/CEMA/TV/VCR SET, TV/VCR Receiver Immunity Set.

IEC 61000-4-3:2006, Testing and measurement techniquesSection 3: Radiated, radio-frequency


electromagnetic field immunity test.6

IEC 61000-4-4:2006, Testing and measurement techniquesSection 4: Electrical fast transient/burst


immunity test.

IEC 61000-4-5:2005, Testing and measurement techniquesSection 5: Surge immunity test.

2
C63 publications are available from the Institute of Electrical and Electronics Engineers, 445 Hoes Lane, Piscataway, NJ 08854,
USA, or from the Sales Department, American National Standards Institute, 25 West 43rd Street, 4th Floor, New York, NY 10036,
USA. (http://standards.ieee.org/).
3
ANSI publications are available from the Sales Department, American National Standards Institute, 25 West 43rd Street, 4th Floor,
New York, NY 10036, USA (http://www.ansi.org/).
4
CEA publications are available from Global Engineering Documents, 15 Inverness Way East, Englewood, CO 80112, USA
(http://global.ihs.com/).
5
EIA publications are available from Global Engineering Documents, 15 Inverness Way East, Englewood, CO 80112, USA
(http://global.ihs.com/).
6
IEC publications are available from the Sales Department of the International Electrotechnical Commission, Case Postale 131, 3, rue
de Varemb, CH-1211, Genve 20, Switzerland/Suisse (http://www.iec.ch/). IEC publications are also available in the United States
from the Sales Department, American National Standards Institute, 25 West 43rd Street, 4th Floor, New York, NY 10036, USA
(http:// www.ansi.org/).

2
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ANSI C63.15-2010
American National Standard Recommended Practice for the Immunity Measurement of Electrical and Electronic
Equipment

IEC 61000-4-6:2001, Testing and measurement techniquesSection 6: Immunity to conducted


disturbances, induced by radio-frequency fields.

IEC 61000-6-1, Electromagnetic Compatibility (EMC)Part 6: Generic StandardsSection 1: Immunity


for Residential, Commercial and Light-Industrial Environments.

IEC 61000-6-2, Electromagnetic compatibility (EMC) Part 6-2: Generic standards Immunity for industrial
environments.

IEEE Std 299, IEEE Standard Method for Measuring the Effectiveness of Electromagnetic Shielding
Enclosures.7, 8

IEEE Std C95.1, IEEE Standard for Safety Levels with Respect to Human Exposure to Radio Frequency
Electromagnetic Fields, 3 kHz to 300 GHz.

ISO/IEC 17025, General Requirements for the Competence of Calibration and Testing Laboratories.9

MDS-201-0004, Electromagnetic Compatibility Standard for Medical Devices


(http://www.fda.gov/cdrh/ode/638.pdf).

MIL-HDBK-454A, Department of Defense Handbook, General Guidelines for Electronic Equipment.10

MIL-STD-461E, Requirements for the Control of Electromagnetic Interference Characteristics of


Subsystems and Equipment (http://www.jsc.mil/jsce3/emcslsa/stdlib/LibDisplay.asp?folder=ms).

MIL-STD-462, Department of Defense Test Method Standard for Measurement of Electromagnetic


Interference Characteristics.

NBS TN-1013, July 1981: Using a TEM Cell for EMC Measurements of Electronic Equipment, Crawford,
M. L.; Workman, J. L.11

RCTA DO-160E, Radio Technical Committee for Aircraft, Environmental Conditions and Test Procedures
for Airborne Equipment (http://www.rtca.org/).

3. Definitions
The definitions in ANSI C63.14 apply. Definitions in particular product standards or in applicable
regulations take precedence.
dBrnC: Noise power above a reference noise measured by a set with C-message weighting.
dBSPL: Sound pressure level relative to a particular noise as a reference source.

7
IEEE publications are available from the Institute of Electrical and Electronics Engineers, Inc., 445 Hoes Lane, Piscataway, NJ
08854, USA (http://standards.ieee.org/).
8
The IEEE standards or products referred to in this clause are trademarks of the Institute of Electrical and Electronics Engineers, Inc.
9
ISO/IEC publications are available from the ISO Central Secretariat, 1, ch. de la Voie-Creuse, Case postale 56, CH-1211 Geneva 20,
Switzerland (http://www.iso.ch/). ISO/IEC publications are also available in the United States from the Sales Department, American
National Standards Institute, 25 West 43rd Street, 4th Floor, New York, NY 10036, USA (http://www.ansi.org/).
10
MIL publications are available from Customer Service, Defense Printing Service, 700 Robbins Ave., Bldg. 4D, Philadelphia, PA
19111-5094.
11
This NBS publication is no longer in publication. However, a copy of this standard is available at some university libraries as well
as from the IEEE-SA.

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ANSI C63.15-2010
American National Standard Recommended Practice for the Immunity Measurement of Electrical and Electronic
Equipment

4. General requirements

4.1 Safety precautions

WARNING
Electric Shock Hazard: Precautions against electric shock hazard should be taken when
ac-operated test instrumentation is used and when test instrumentation is connected to power
circuits. There are numerous requirements for leakage currents and the precautions given in
manufacturers manuals and local codes need to be considered. The following are two
examples:
In MIL-HDBK-454A, it is specified that in normal use if the open circuit potential to ground is
more than 25 V (ac) and the current with a 1500 load is more than 4 mA (dc) and 1 mA (ac) a
shock hazard exists.
In Europe this amplitude is 0.75 mA for handheld equipment and 3.5 mA for floor standing
equipment.

WARNING
Nonionizing Radiation Exposure Hazard: IEEE Std C95.1 specifies safety levels and guidelines
with respect to human exposure to radio frequency electromagnetic fields. Fields that exceed
these safety levels are possible when using the test instrumentation in this recommended
practice, particularly when the test instrumentation is used to perform radiated immunity testing.
Precautions against exposing personnel to these electromagnetic fields should be taken.

4.2 Input power requirements

If the test instrument requires ac power, it should operate on a supply that meets its specifications for
voltage and frequency. The test instrumentation should have adequate power-line filtering to prevent
erroneous or undesirable operation due to power-line interference.

4.3 Measurement tolerances

The general tolerances are derived from MIL-STD-461E. Unless otherwise stated for a particular
measurement, the tolerance of the value stated shall be as follows:

a) Distance: 5%
b) Frequency: 2 %
c) Amplitude, measurement receiver: 2 dB
d) Amplitude, measurement system (includes measurement receivers, transducers, cables, etc.):
3 dB
e) Time (waveforms): 5 %
f) Resistance: 5 %
g) Capacitance: 20 %

4
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ANSI C63.15-2010
American National Standard Recommended Practice for the Immunity Measurement of Electrical and Electronic
Equipment

4.4 Annexes

The annexes provide a tutorial on immunity, a view of performance degradation criteria and the
recommended test equipment (Annex B) for test methods that were obtained from the obsolete and detailed
reference documents.

4.5 Test reports

The test report shall provide the following:

a) Graphical or tabular data showing the frequencies and amplitudes at which the test was
performed
b) Data on any immunity threshold and the associated frequencies that were determined for each
immunity test
c) Indication of compliance for each test in a summary table
d) Measurement uncertainty if applicable (see ISO/IEC 17025 for guidance)

5. Conducted immunity
Conducted interference may degrade electronic product operation as it enters the product via ac power, dc
power, signal, communication, telemetry lines, and receiver antenna input. Hence, these lines must be
immune to common conducted interfering signals comprised of steady-state, transient, and other signal
types typically found in radio frequency (RF) ambient and product locations.

5.1 CI-1: Power-line immunity, 30 Hz to 150 kHz

5.1.1 General considerations

This test method is used to verify the ability of the equipment under test (EUT) to withstand ripple voltages
present on power leads. Since the applied voltage is coupled in series using a transformer, Kirchhoffs
voltage law requires that the voltage appearing across the transformer output terminals must drop around
the circuit loop formed by the EUT input and the power source impedance. The voltage specified by the
product specification is measured across the EUT input because part of the transformer voltage can be
expected to drop across the source impedance.

5.1.2 Measurement procedure

Use the measurement procedure given in Method CS101, MIL-STD-461E.

5.1.3 Performance degradation

Performance criterion should be established using the guidelines described in Annex A.

5.1.4 Suggested immunity levels

The suggested immunity level is shown in Figure CS 101-1 of MIL-STD-461E, Curve 1.

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American National Standard Recommended Practice for the Immunity Measurement of Electrical and Electronic
Equipment

This limit is 136 dBV (6 V) from 30 Hz to 5 kHz on lines greater than 28 V and decreases as a log
function (linear on a log scale) to 106.5 dBV (0.21 V) at 150 kHz.

NOTETest voltages are in terms of the rms value of a sine wave.

5.2 CI-2: Power-line and signal-line immunity, bulk current injection, 10 kHz to
200 MHz

5.2.1 General considerations

This test method is used to verify the ability of the EUT to withstand RF signals present on interconnecting
cables, including power leads. This type of test is often considered a bulk current test because current is the
parameter measured. However, it is important to note that the test signal is inductively coupled and that
Faradays law predicts an induced voltage in a circuit loop with the resultant current flow and voltage
distribution dependent on the various impedances present.

This method induces levels on all wires at a connector interface simultaneously (common mode) which
simulates actual use.

Testing is required on both entire power cables and power cables with the neutral or grounded conductors
removed to evaluate common-mode coupling to configurations that may be present in different
installations.

In some installations, the neutral or grounded wire is routed with the line conductor. In other installations,
neutrals or grounded conductors are tied to the grounded system structure near the utilization equipment.

The entire grounded system structure is being used as the power return path.

5.2.2 Measurement procedure

Use the measurement procedure given in Method CS114, MIL-STD-461E to 200 MHz.

Optionally, IEC 61000-4-6 may be used over the frequency range of 150 kHz to 230 MHz.

5.2.3 Suggested immunity level

The suggested immunity level is shown in Curve 3 of Figure CS 114-1 of MIL-STD-461E.

It is 49 dBA (282 A) at 10 kHz increasing to 89 dBA (28 mA) at 1 MHz to 30 MHz and it is decreasing
to 77 dBA (7 mA) at 400 MHz.

5.3 CI-3: Communications receiver antenna input immunity (receivers other than
broadcast), 30 Hz to 10 GHz

5.3.1 General considerations

This test method is applicable for determining the immunity or front-end rejection of receivers operating in
the frequency range of 30 Hz to 10 GHz. This test method is derived from an earlier version of
MIL-STD-462 that is no longer available.

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ANSI C63.15-2010
American National Standard Recommended Practice for the Immunity Measurement of Electrical and Electronic
Equipment

5.3.2 Immunity signal

The EUT should be subjected to the signal levels as defined by Figure 1. With regard to Figure 1, note the
following:
a) The limit at A is 80 dB above the input level required to produce the standard reference output.
b) The limit at B should be 0 dBm applied directly to the receiver input terminals. Caution is
advised that 0 dBm may be too severe for certain receivers. For example, a receiver with a
sensitivity of 1 mV will require 107 dB of rejection outside the tuning band, which is a severe
requirement.

5.3.3 Test setup and procedure

The following steps should be used as a test procedure:


a) Use the general setup as shown in Figure 2. With the EUT operating and Signal Source No. 2
turned off, tune Signal Source No. 1 to f0, which should be the receiver-tuned frequency.
b) Adjust the output of Signal Source No. 1 to produce the standard reference output at the
receiver.
NOTEThe standard reference is to be specified by the manufacturer. It could be the receiver
sensitivity.
c) Record the un-modulated output level and frequency of Signal Source No. 1.
d) Set the modulation for Signal Source No. 1 so as to produce the standard reference output as
required by the receiver specification.
e) Repeat steps a) through d) using Signal Source No. 2 with Signal Source No. 1 switched off.
f) For the remainder of the test, have Signal Source No. 1 on and modulated as in step d), and have
Signal Source No. 2 on but un-modulated.
g) Set Signal Source No. 1 with its proper modulation to the frequency and level as initially
determined and set Signal Source No. 2, with no modulation, to the levels shown in Figure 1.
h) The frequency limits are such that the lowest test frequency should be the lower of IF/5 or
0.05 f0, where IF is the receiver IF frequency and f0 is the receiver-tuned frequency. For multiple
conversion receivers, select the lowest IF.
i) The highest frequency for this test should be the higher of 5 fLO + IF or 20 f0 (but less than
10 GHz) where fLO is the receiver local oscillator frequency, f0 the receiver-tuned frequency, and
IF is the receiver intermediate frequency.
j) For multiple conversion receivers the fLO and IF should be the highest frequencies associated
with the receiver.
k) For receivers with waveguide input, the lowest test frequency should be 0.8 fCO where fCO is the
waveguide cut-off frequency.
l) Note that the frequency range defining the 80 dB selectivity points (w in Figure 1) is exempt
from this test.
m) While scanning the required frequency range with Signal Source No. 2, note any receiver
responses.
n) Check to make sure that the response noted is a spurious one and not due to an inter modulation
product. Reducing the level of Signal Source No. 1 to see if the response disappears can do this.
If it does not disappear, then it is a true spurious response.

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American National Standard Recommended Practice for the Immunity Measurement of Electrical and Electronic
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o) After determining that a true spurious response has been found, returning Signal Source No. 1 to
its original level and reduce the level of Signal Source No. 2 until the standard receiver
reference output is obtained. The difference, in dB, between this level on Signal Source No. 2
and the level determined initially on Signal Source No. 2 at the receiver-tuned frequency, is the
spurious response rejection.
p) Record frequency and level of Signal Source No. 2.
Signal Source No. 1 should always be modulated in the same manner as specified in the section pertaining
to receiver sensitivity measurements of the detailed equipment specification. When the equipment
specification does not define this, the following should be used:

AM receivers: The signal generator should be 80 % modulated by a 1 kHz sine wave.


SSB and FM receivers: The signal generator should be un-modulated.
Pulse receivers: The modulation pulse should be adjusted so that 80 % of its spectral energy lies
within the 3 dB bandwidth of the receiver.
The signal generators emit a substantial amount of harmonics and other spurious energy. Care should be
taken not to mistake an emission of the generator falling on f0 for a spurious response of the equipment. It is
possible to have spurious responses at f0/2, f0/3, f0/4, etc. that are not due to generator harmonics. In order to
guard against the effects of signal generator harmonics, it is necessary to use high- and low-pass filters as
necessary throughout the test.

Consideration must be given to the number of receiver-tuned frequencies to be considered for this test on a
given piece of equipment as well as the number of receiver-tuning steps.

The standard reference output should be defined for this test. A possible reference might be an output that
produces 30 dB quieting, or 10 dB signal (S) plus noise (N) plus distortion (D) divided by noise plus
distortion, i.e., (S + N + D)/(N + D).

A suitable test for receiver image frequency rejection may be appropriate.

5.3.4 Performance degradation

The pass/fail criterion for this test is that the EUT should demonstrate the front-end receiver rejection of
undesired signals as defined in Figure 1.

5.3.5 Test equipment

The test equipment required to perform this test is as follows:


a) Signal generator (two may be required)
1) Frequency range: 10 kHz to 10 GHz
2) Frequency accuracy: 1 %
3) Output voltage range: Standard reference + 80 dB [Example: Standard reference = 0 dBV
(107 dBm) to 80 dBV (27 dBm)]
4) Harmonic and spurious signal: more than 30 dB down from fundamental. External filtering
may be needed to meet this requirement.
5) Modulation characteristics: FM CW, AM to 1 GHz, pulse above 200 MHz
b) Low- and high-pass filters (to remove signal generator harmonics as required)
1) Impedance: 50
2) Power rating: 1 W or greater

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ANSI C63.15-2010
American National Standard Recommended Practice for the Immunity Measurement of Electrical and Electronic
Equipment

c) Power splitters (three-port network)


1) Frequency range: dc to 10 GHz (several types may be required)
2) Insertion loss: < 6 dB
3) Impedance: 50
4) Power rating: 1 W or greater
d) Attenuators (two required, one each at output of signal sources)
1) Frequency range: dc to 10 GHz
2) Impedance: 50
3) Power rating: 1 W or greater
4) Attenuation: 10 dB

Figure 1 Test signal definitions

f0 = Receiver-tuned frequency
f1 = Lowest tunable frequency of receiver band in use
f2 = Highest tunable frequency of receiver band in use
w= Bandwidth between 80 dB points of the receiver selectivity curve as defined in the test sample
technical requirements or the control plan

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American National Standard Recommended Practice for the Immunity Measurement of Electrical and Electronic
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Figure 2 CI-3 Communications receiver antenna input immunity general test setup

5.4 CI-4: Receiver antenna input immunity for TVs and VCRs, 0.5 MHz to 30 MHz

5.4.1 General considerations

The purpose of this test is to demonstrate that the TV or VCR is immune to signals other than the intended
signal at its RF input terminals.

5.4.2 Measurement procedure

Use the measurement procedures given in ANSI/EIA 544, CEA-31, EIA IS-16, and EIA/CEMA/TV/VCR
SET, TV/VCR Immunity Set.

5.5 CI-5: Power/interconnection line surge voltage

5.5.1 General considerations

The purpose of this test is to determine if the EUT is immune to high-energy disturbances on power-lines
and interconnecting power-lines as a result of transients caused by switching systems or lightning.

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American National Standard Recommended Practice for the Immunity Measurement of Electrical and Electronic
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5.5.2 Measurement procedure

Use the measurement procedure given in IEC 61000-4-5.

5.5.3 Suggested immunity level

The suggested immunity level can be selected from Table 1. All the test levels below the suggested level
should also be tested. The suggested level for power-lines is 1 kV line-to-line and 2 kV lines to protective
earth. Signal lines are generally not surge tested.
Table 1 Test severity levels
Open circuit test voltage
Level
kV ( 10 %)
1 0.5
2 1.0
3 2.0
4 4.0
X Special

NOTE X is an open level. This level must be specified in the product specification.

5.6 CI-6: Electrical fast transient/burst

5.6.1 General considerations

The purpose of this test is to determine if the EUT is immune to repetitive fast transients (bursts), on
supply, signal, and control ports as a result of transient disturbances caused by switching transients
(interruption of loads, relay contact bounce, etc.).

5.6.2 Measurement procedure

Use the measurement procedure given in IEC 61000-4-4.

5.6.3 Suggested immunity level

The suggested immunity level is Level 2 for signal and power-lines in accordance with Table 2.
Table 2 Test voltages
On power supply port, PE On I/O (input /output) signal
data and control ports
Level Voltage peak Repetition rate Voltage peak Repetition rate
kV kHz kV kHz
1 0.5 5 or 100 0.25 5 or 100
2 1 5 or 100 0.5 5 or 100
3 2 5 or 100 1 5 or 100
4 4 5 or 100 2 5 or 100
X Special Special Special Special
NOTE 1Use of 5 kHz repetition rates is traditional; however, 100 kHz is closer to reality. Product committees should
determine which frequencies are relevant for specific products or product types.
NOTE 2With some products, there may be no clear distinction between power ports and I/O ports, in which case it is
up to product committees to make this determination for test purposes.
NOTE 3X is an open level. The level must be specified in the dedicated equipment specification.

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American National Standard Recommended Practice for the Immunity Measurement of Electrical and Electronic
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5.7 CI-7: Telecommunications terminal equipment line voice band line immunity,
10 kHz to 30 MHz

5.7.1 General considerations

The purpose of this test is to determine the immunity level of the EUT to conducted electromagnetic energy
that may be present at the telecommunications network interface (NI). It should be noted that RF energy
may also couple to customer-owned premises wire or be radiated directly into the terminal equipment.

5.7.2 Immunity signal

The test signal should be swept from 10 kHz to 30 MHz and be 80 % amplitude modulated by a 1 kHz
sinusoidal signal.

5.7.3 Test set-up and procedure

The test circuit used for the measurements is shown in Figure 5. The 48 Vdc provided to the EUT by the
central office battery is simulated by a 48 Vdc power supply that includes a 200 resistor on each output
conductor. An RF filter is used to prevent the test signal from entering the power supply. To simulate the
variations of dc voltage and current at the EUT due to loop length, the loop resistance simulator provides
either zero resistance (e.g., subscribers near central officeshort loops) or 1200 (600 per conductor)
to simulate long loops.

Two RF signal injection circuits are used. As shown in Figure 6 and Figure 7, one circuit is used to inject
differential-mode signals and the other to inject common-mode signals. The differential-mode and
common-mode impedance of these circuits are 135 for differential-mode and 90 for common-mode,
are as described in Figure 3. The termination should be allowed to have 100 metallic impedance and
90 longitudinal impedance above 6 MHz. By inserting a variable capacitor from one side of the circuit to
ground (see Figure 7), an unbalance to ground is created and a differential-mode signal results from an
injected common-mode signal.

A transmission test set is used to monitor the noise level, in dBrnC, of the RF signal demodulated by the
EUT. An RF filter should be used at the input of the transmission test set to prevent demodulation of the RF
signal by the transmission test set.

Measurement of the interfering signal is done with a termination network (see Figure 3 and Figure 4) in
place of the EUT, and with a receiver having an input impedance of 50 . All reference points (RPs) are
connected to a metallic reference plane on which the EUT is placed (see Figure 5). The purpose of the
reference plane is to provide a capacitive path for common-mode signals, because EUTs may not have a
connection to ground.

Measurements should be made with the EUT in the on-hook and off-hook states. If the EUT is supplied
with a microphone, the microphone should be muffled to reduce the ambient voice band noise pickup.

The EUT should be tested with the following signals:

Differential-mode signal only


Common-mode signal only
Common-mode signal with a capacitive unbalance to the reference point to generate a
differential-mode signal (see Figure 7)

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American National Standard Recommended Practice for the Immunity Measurement of Electrical and Electronic
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The injected signal is increased until 20 dBrnC of noise (demodulated 1 kHz signal) is measured at the
transmission test set with the EUT connected. Then, without changing signal levels from the RF signal
injection circuit, the EUT is substituted by the termination network that provides reference differential-
mode and common-mode impedances. Voltage measurements (differential-mode and common-mode) of
the injected signal across the termination network are then made with the receiver.

Measurement of conducted RF should be recorded in terms of mV or dBmV. Appropriate corrections must


be made to the receiver readings based on the termination network used for common-mode measurements.
This is due to the voltage divider circuit of the termination network (see Figure 3). The common-mode
voltage is the total voltage drop across the two 67.5 resistors in parallel, in series with the 56.3 resistor
to ground.

5.7.4 Performance degradation

Degradation criterion should be established using the guidelines described in Annex A.

5.7.5 Test equipment

The test equipment required to perform this test is as follows:

a) EMI receiver (as specified in ANSI C63.2) A frequency selective meter should be used for the
measurements. The frequency selective meter may consist of a receiver, spectrum analyzer, or
frequency selective voltmeter. For differential-mode measurements, the meter must have a
balanced input unless a balance-to-unbalance (balun) transformer termination network is used
[see item b)]. The frequency response of the meter should be flat ( 3 dB) for 10 kHz to
30 MHz.
b) Balun network
1) Frequency range: 10 kHz to 30 MHz
2) Balance side: 135
3) Unbalance side: 50
c) Two 5 F capacitors, which should be matched to preserve the balance of the circuit. Capacitors
should not become inductive below 30 MHz. Good results have been obtained from
polypropylene capacitors.
d) Telephone termination network, ZM = 135 (100 above 6 MHz), ZL = 90
Figure 3 shows a schematic diagram of the termination network. This termination network terminates the
EUT in differential-mode and common-mode impedances simultaneously. The common-mode conversion
loss of the termination network should be greater than 60 dB in the frequency range from 10 kHz to 1 MHz,
and greater than 40 dB in the frequency range from 1 MHz to 30 MHz.

Figure 4 is an example of the balun termination network. This type of termination network allows the use
of unbalanced frequency-selective meters.

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American National Standard Recommended Practice for the Immunity Measurement of Electrical and Electronic
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Figure 3 Termination network

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American National Standard Recommended Practice for the Immunity Measurement of Electrical and Electronic
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Figure 4 Balun termination (metallic and longitudinal)

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Figure 5 Test circuit

Figure 6 Injection circuit (differential mode only)

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American National Standard Recommended Practice for the Immunity Measurement of Electrical and Electronic
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Tip

5 F

67.5 Balun
135:50

5 F 96 ~

Unbalance
capacitor

Reference
Point

Ring
Figure 7 Injection circuit (common mode/differential mode)

5.8 CI-8: Telecommunications telephone terminal equipment, immunity


requirements for equipment having an acoustic output, 150 kHz to 30 MHz

5.8.1 General considerations

The purpose of this test is to determine the immunity of telephone terminal equipment (TTE) to RF signals.
For this subclause the term TTE applies only to an electronic device that has a wire line connection to the
public telecommunications network. In addition, the compliance criteria related to an acoustic output is
only specified for the acoustic output from a handset receiver.

5.8.2 Measurement procedure

Use the measurement procedure given in ANSI/TIA/EIA-631.

5.8.3 Immunity signal

The test signal should be swept from 150 kHz to 30 MHz and be 80 % amplitude modulated by a 1 kHz
sinusoidal wave. The amplitude of the un-modulated conducted signal shall be 3 V rms.

5.8.4 Compliance criteria

5.8.4.1 Receive (near-end interference)

The demodulated acoustic output from the handset receiver of the TTE shall not exceed 55 dBSPL, except
in the frequency band from 500 kHz to 2 MHz, where the demodulated acoustic output shall not exceed
45 dBSPL, measured at 1 kHz in all off-hook operating states that affect compliance. If the TTE is
equipped with receive volume control, the control shall be set to produce the nominal Receive Objective

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American National Standard Recommended Practice for the Immunity Measurement of Electrical and Electronic
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Loudness Rating (ROLR) specified in ANSI/TIA-470A for analog TTE and ANSI/TIA-579 for digital
TTE.

5.8.4.2 Transmit (far-end interference)

For analog equipment, the demodulated signal output measured on-hook and off-hook at the artificial
central office (CO) termination shall not exceed 55 dBV (1.77 mV), except in the frequency band from
500 kHz to 2 MHz, where the demodulated signal output shall not exceed 65 dBV (0.56 mV), when
measured at 1 kHz for all operating states that affect compliance. For digital equipment, the EUT is
connected to a compatible digital telephone. The demodulated acoustic output from the handset receiver of
the compatible telephone shall comply with the receive criteria above.

6. Radiated immunity

6.1 RI-1: Uniform magnetic field immunity, Helmholtz coil, 30 Hz to 100 kHz

The purpose of this test is to determine if the EUT is immune to magnetic fields over the frequency range
of 30 Hz to 100 kHz with a magnetic field strength of 140 dBpT (10 T).

6.1.1 Measurement procedure

The measurement procedure shall be as given in 5.18.4 through 5.18.4.4 of MIL-STD 461E Method
RS101.

6.1.2 Description of the Helmholtz coil

The Helmholtz coil consists of two identical coils spaced a distance of one coil radius apart. Using the test
equipment specified, the magnetic field strength produced by a known current through the coils can be
determined by Equation (1):

0.7155 NI
H= (1)
R

where
H = the magnetic field in amperes per meter (A/m)
N = the number of turns per coil
I = the coil current in amperes
R = the coil radius in meters

NOTE 1B = H in air, i.e., B(dBpT) = H(dBA/m) + 2 dB(pT = picotesla = 1012 Tesla = 106 T).

Vary the output level of the function generator as indicated in the appropriate specification, within the
limitations of the power amplifier. The coils are connected series aiding. Use H = 7.96 A/m (140 dBpT)
unless required to be otherwise by the equipment specifications.

NOTE 2The 7.96 A/m value represents a practical maximum field strength that can be produced by a reasonably
sized amplifier and a Helmholtz coil.

For EUTs with dimensions less than one coil radius, use a standard Helmholtz configuration (coils
separated by one coil radius). For EUTs with dimensions greater than one coil radius, use the optional
configuration. Select a coil separation such that the plane of the EUT face is at least 5 cm from the plane of
the coils and such that the separation between the coils does not exceed 1.5 times the radii.

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American National Standard Recommended Practice for the Immunity Measurement of Electrical and Electronic
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6.2 RI-2: Magnetic field immunity, point source, 30 Hz to 100 kHz

The purpose of this test is to determine if the EUT is immune to small-area magnetic fields over the
frequency range of 30 Hz to 100 kHz.

6.2.1 Measurement procedure

Use the measurement procedure given in Method RS 101 of MIL-STD-461E.

6.2.2 Suggested immunity level

The suggested immunity level shall be as shown in Figure RS 101-2 of MIL-STD-461E, 180 dBpT
(1000 T) from 30 Hz to 60 Hz, then decreasing to 116 dB pT (0.6 T) at 100 kHz.

6.2.3 Correction factor

To convert measurement receiver readings expressed in decibels above one microvolt (dBV) to decibels
above one picotesla (dBpT), add the factor shown in Figure 8.

Figure 8 Correction factor from dBV (add to meter reading) to dBpT for a meter
with 50 input impedance

6.3 RI-3: Power frequency magnetic induction field

The purpose of this test is to determine if the EUT signal lines are immune to power frequency inductive
fields. This method is derived from MIL-STD-462.

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American National Standard Recommended Practice for the Immunity Measurement of Electrical and Electronic
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6.3.1 Measurement procedure and test setup

Set up the test equipment as shown in Figure 9. The EUT cables to the support equipment should be
representative of the actual installation. Care should be taken to isolate the support equipment from upset or
to adequately discern support equipment upset from EUT upset. With the equipment connected as shown,
tune the function generator to the EUT power frequency. Using the ac monitoring device connected across
the shunt resistor, calculate the ac power frequency current being applied to the test wire. Adjust the
function generator output until the desired ac power frequency current is reached. Monitor the EUT for
evidence of malfunction or degradation of performance during testing. If malfunction or degradation of
performance is observed from the EUT, lower the level of the immunity field until a threshold immunity
level is obtained. Document the frequency and current level of the EUT immunity threshold.

6.3.2 Immunity signal

Using the test equipment specified, 20 A of current can be applied to the test wire at the EUT power
frequency for this test method.

6.3.3 Performance degradation

Degradation criterion should be established using the guidelines described in Annex A.

6.3.4 Required test equipment

The test equipment required to perform this test is as follows:


a) Insulated test wire
1) Gauge: No. 14 AWG
2) Length: dependent on test sample size
b) Audio isolation transformer (two required)
1) Primary impedance: 5 or less
2) Secondary impedance: 1/4 of the primary impedance
3) Frequency response: 30 Hz to 1 kHz
4) Audio power rating: 100 W
5) Secondary saturation: 50 A ac or dc maximum
6) Turns ratio: two-to-one step down with an additional identical secondary winding for
connection of a voltmeter
7) Size: 11.4 cm 13.3 cm 15.9 cm (4.5 in 5.25 in 6.25 in)
c) Function generator or audio oscillator (waveforms: sine, triangular, or square, as required)
1) Frequency range: 30 Hz to 1 kHz
2) Frequency accuracy: 3 %
3) Output: 0 V to 3 V
d) Audio amplifier
1) Frequency range: 30 Hz to 1 kHz
2) Power output: 100 W
3) Output impedance: 2
e) AC voltmeter

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American National Standard Recommended Practice for the Immunity Measurement of Electrical and Electronic
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1) Input impedance: 100 k or greater


2) Frequency range: 30 Hz to 1 kHz
3) Voltage range: 0.001 V to 5 V
f) Non-inductive resistor, 0.1
1) Resistance: 0.1
2) Tolerance: 1 %
3) Power handling: 100 W

2:1 I=20A
Transformer
Audio AC voltmeter
oscillator or Audio
function amplifier
generator

R1=2.5
Non-inductive Shunt

40 cm 40 cm

Support
EUT
Equipment

NOTEWire is run on and parallel to interconnecting leads. Tape to EUT cable for 2 m in length, or the actual cable
length, whichever is less. Maintain a minimum 40 cm separation from termination at either end of the cable.

Figure 9 Test setup for power frequency induction

6.4 RI-4: Spikes-inductive field immunity

The purpose of this test is to determine if the EUT signal lines are immune to spike-inductive fields. This
method is derived from MIL-STD-462. An alternative method can be found in MIL-STD-461E, CS-115.

6.4.1 Measurement procedure and test setup

For the spike immunity test, set up the equipment as shown in Figure 10. The EUT cables to the support
equipment should be representative of the actual installation. Care should be taken to isolate the support
equipment from upset or to adequately discern support equipment upset from EUT upset. With the
equipment connected as shown measure the spike voltage using the oscilloscope. Adjust the spike generator
output until the desired spike voltage is reached. Monitor the EUT for evidence of malfunction or
degradation of performance during testing. If malfunction or degradation of performance is observed from
the EUT, lower the level of the field until a threshold immunity level is obtained.

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6.4.2 Immunity signal

A 200 V, 10 ms transient is applied to the test wire using the test equipment specified in 6.4.4. This level
shall be measured and calibrated across a 5 resistor.

6.4.3 Performance degradation

Degradation criterion should be established using the guidelines described in Annex A.

6.4.4 Test equipment

The test equipment required to perform this test is as follows:


a) Insulated test wire
1) Gauge: No. 14 AWG
2) Length: dependent on test sample size
b) Spike generator
1) Pulse width: 10 ms
2) Pulse repetition rate: 1 pulse/s to 500 pulses/s PRF (Pulse Repetition Frequency)
3) Voltage output: 0 V to 200 V peak
4) Output impedance: 0.5
5) Pulse decay time: 10 ms
6) Rise time: less than 1 ms
c) Non-inductive resistor
1) Resistance: 5
2) Tolerance: 5 %
3) Power: 10 W
d) Storage oscilloscope with 10x probe
1) Bandwidth: 10 MHz or greater
2) Voltage range: 20 mV to 10 V
3) Impedance: 100 k or greater
NOTEThe 5 resistor is used only during calibration and short-circuited during the test.

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10x
Probe

Oscilloscope
5 non-inductive load
(only used during
Spike calibration)
Generator

40 cm

40

Support
EUT
Equipment

NOTEWire is run on and parallel to interconnecting leads. Tape to EUT cable for 2 m in length, or the actual
cable length, whichever is less. Maintain a minimum 40 cm separation from termination at either end of the cable.
Figure 10Test setup for spike induction field

6.5 RI-5: Electric field immunity in a TEM cell, 10 kHz to 80 MHz

This test is derived from an earlier version of NBS TN 1013. This test may also be performed by the
method RI-6 if the field can be reliably established. The purpose of this test is to determine immunity of
equipment (whose largest dimension is less than 50 cm) to radiated fields over the frequency range of
10 kHz to 80 MHz by using a transverse electromagnetic (TEM) cell (TEM mode).

6.5.1 Measurement procedure

See Annex B for a discussion of the TEM cell set-up and procedure.

6.5.2 Immunity signal

The EUT should be exposed to the vertically polarized electric field generated in the TEM cell at levels up
to the maximum test field specified by the testing requirement or until EUT performance degradation
occurs. The EUT should be rotated to expose each orthogonal axis to the electric field.

6.6 RI-6: Electric field immunity, 80 MHz to 10 GHz

The purpose of this test is to determine if the EUT is immune to radiated electric fields over the frequency
range of 80 MHz to 10 GHz.

6.6.1 Measurement procedure

Use the measurement procedure given in IEC 61000-4-3.

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6.6.2 Suggested immunity level

The suggested level for residential, commercial or light industrial environments is 3 V/m. The suggested
level for industrial environments is 10 V/m.

Light industrial environments are defined as those locations that are characterized by being supplied
directly at low voltage from the public mains network. Industrial environments are characterized by the
existence of one or more of the following:

a) Power network exists powered by a high or medium voltage power transformer dedicated to
supply of an installation feeding manufacturing or similar plant.
b) Industrial, scientific or medical (ISM) apparatus.
c) Heavy inductive or capacitive loads are frequently switched.
d) Currents and associated magnetic field strengths are high.

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Annex A

(informative)

Immunity testing tutorial

A.1 Basic issues

The basic problems in establishing a universal measurement technique for immunity testing can be
summarized as follows:

a) Establishing a known test (immunity) field or signal that adequately simulates (or represents) a
real world EM environment at locations where electronic equipment operates.
b) Repeating the identical immunity field or signal in successive test runs at different locations/test
facilities for different EUTs and for different configuration and operational environments.
c) Exposing the EUT and its associated leads over the entire volume in a test facility using
efficient and cost effective methods that do not interfere with other processes or experiments.
d) Monitoring performance degradation/failure without disturbing the applied immunity field
incident on the EUT, and setting adequate degradation thresholds.
e) Maintaining a current, technologically-sound test facility without obsolescing existing chambers
and instrumentation.
.

A.2 Immunity environment

A good knowledge of the EM environment, present and future, would be ideal to have. However, these
environments near broad categories of electronic equipment are not well known. General RF environmental
studies that have been made include those by the U.S. Environmental Protection Agency (EPA) and
Canadian Department of Communications. The results of those studies provide useful estimates for
broadcast services. Past experiences with specific product immunity cannot be relied upon since the EM
environment is changing rapidly and the products are being updated with more sensitive electronics. Hence,
setting immunity criteria may come down to recognizing that a product will at some time in its use
experience a minimum EM field.

Various studies have shown that electronics equipment will be exposed to 1 V/m or less for 95% of the
time. It is further indicated that this level is broadband and applies for all frequencies above 10 kHz. This
type of immunity level could well be stipulated for the Noticeable Degradation susceptibility criteria. Of
course, the appropriate type of modulation or pulse repetition rate of keying, for example, would have to be
stipulated. These additional requirements would be made based on engineering an immunity test that would
provide an electromagnetic disturbance signal that is most likely to duplicate the types of interference that
will be encountered.

It should be noted that merely representing the licensed radio service might not be totally indicative of the
effect that the RF environment has on susceptible products. For example, where audio rectification effects
in linear circuits are of concern, it is not advisable to simulate only the FM modulation associated with
certain broadcast environments. Field experience has shown that it is the residual AM modulation due to
multi-path propagation in these environments that is primarily responsible for audible interference. Levels
of 6% or more amplitude modulation are typical within steel-framed buildings.

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A.3 Immunity trade-offs

Consumer electronic products are competitively priced, with a high expectation of safety, performance,
reliability, ease of operation, and a number of other attributes that the public considers important. The
market demonstrates that by and large these expectations are being met. Electronics are being added to
replace functions that where previously mechanical or electromechanical, and/or providing functionality
that did not previously exist; however, it has resulted in products significantly more susceptible to the EM
environment. The plethora of products having high saturation in U.S. households together with people
living closer together has complicated the problem.

The Citizens Band Radio (CB) explosion of the past awakened the consumer electronics industry to the
necessity of improving their designs to meet a hostile EM environment. There are mixed signals of success.
EMI immunity is complicated and not achieved by simple or easy solutions. Good engineering practice
now denotes sophistication commensurate with that of the product itself. Economics dictates against
shotgun approaches such as shielding the product within a metal box, although the technique may apply to
certain circuits.

The manufacturer faces the EMI immunity trade-off of pricing its product out of the market or failing to
meet the expectations of most of its customers. Each manufacturer, by intent or accident, establishes some
level of EMI immunity, which is determined by a number of factors. Significant factors include the
following:
a) Type of product (audio, video, radio, television, digital)
b) Product environment (home, auto, etc.)
c) Designated market (or country where the design specifications are set)
d) Awareness of problems (access to and action on field service information)
e) Product cost (absolute and relative to similar products)
f) Depth of engineering

A.4 Present day radiated immunity test facilities

Key to the five basic measurement problems for radiated E-field immunity is the adequacy and limitations
of present day test facilities, which are summarized in the subclauses that follow.

A.4.1 Open-area test sites

All other parameters considered, ideally one would want to measure radiated equipment immunity knowing
that no other object would affect the results. Indeed, the interactions among the EUT, antenna used to
reproduce the desired field, and surrounding conducting/reflecting objects are minimized in an open field.
In addition, there is no EUT size limitation. Theoretically with the right antenna(s), full spectrum testing is
possible. However, there are disadvantages, such as the following:

a) The ambient EM environment may affect the test results.


b) Generating an immunity test field may affect other radio frequency services and in fact may be
disallowed by regulatory agencies. 12
c) This approach is limited to discrete frequencies and requires an experimental license to radiate
the test field.

12
For example, an FCC Public Notice dated July 3, 1996 describes conditions about use of outdoor test sites for RF immunity testing;
(http://www.fcc.gov/oet/ea/eameasurements.html); (http://www.fcc.gov/Bureaus/Miscellaneous/Public_Notices/1996/pnmc6033.txt).

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d) Real estate may not be available or may not have sufficiently uniform ground conductivity to
permit repeatable tests. This is true especially during extremes in weather unless special
construction is applied to provide a uniform ground, e.g., a conducting metal ground plane, an
all-weather capability.
e) The facility should be physically a part of the engineering design environment for quick access.
f) Limitations exist for generating sufficiently high-level susceptibility test fields over the required
volumes because of antenna efficiency and cost of high-power amplifiers. This often leads to
performing the tests in the near field where field components are large but with arbitrary
polarization and large field gradients.
Manufacturers routinely use quasi-open-field testing on a qualitative basis when they take new models to
locations that pose difficult interference problems. This is an acceptable method of evaluating interference
susceptibility in the absence of a regulatory limit, since the source(s) are already part of the general RF
ambient.

A.4.2 Shielded enclosures

To reduce the EM background noise when making low-level emission tests and to contain immunity test
fields, shielded enclosures with no absorbing material on the walls and ceiling are not generally used
anymore.

Studies have shown that there are significant differences in measurements made in various shielded rooms
using the same test setup. Results indicate that repeatability is sometimes difficult to achieve from day-to-
day and among various test personnel performing the same test in the same room. Reported errors up to
+40 dB when compared to similar open field test setups at frequencies above 20 MHz have been found due
to room resonances and standing waves. The interaction among immunity test fields launched by antenna,
room walls, and the EUT also cause errors of varying magnitudes. In addition, the immunity fields
generally require costly, high-power amplifiers because of the antenna efficiency and the location of
standing wave nulls. Below about 50 MHz, the EUT is exposed to the near field of the generated signal
components with field strength much higher than desired and with arbitrary polarization.

The inherent problems of testing in untreated shielded rooms have led to a proliferation of new immunity
test methods that yield less error than those that occur when testing in shielded rooms. The following
subclauses analyze a few of these new techniques that have been successfully used in assessing the
immunity of electronic devices over certain frequency ranges.

A.4.3 Anechoic shielded rooms

Anechoic shielded rooms can be ferrite lines, absorber lined, or hybrid (both ferrite and absorber). The
usable frequency range of these chambers will depend upon the size of the chamber and the absorber, tiles
or both deployed in the design. In general, these sites are evaluated against an ideal open area test site for
emissions testing and ideal uniformity requirements for immunity testing.

A.4.4 Transverse electromagnetic cells

One test facility that is usable at frequencies down to virtually dc is called a TEM cell. TEM cells that are
absorber loaded to obtain uniform fields over larger areas than standard TEM cells are usable to the GHz
range. TEM cells have been extensively evaluated and are used by several consumer electronics
manufacturers, including the automotive industry. Like the shielded room, immunity test fields are
contained within the cell structure. For TEM cells that have tapers on both ends, repeatable test fields can
be generated up to a frequency at which the cell multi-modes and becomes a resonant cavity. A 2 m
absorber-lined cell, suitable for measuring large TV receivers, has been demonstrated to be effective to
220 MHz. The frequency at which the cell multi-modes is inversely proportional to the size of the cell and
hence the size of the EUT that can be tested. Commercial TEM cells can readily provide circuit board
testing up to 1 GHz or higher. The TEM cell has another advantage of being reciprocal so that, within

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certain limitations, it can be used to measure radiated emissions from the EUT. Its efficiency in this mode
allows low-level radiation in the microwatt region to be measured. The prime disadvantage is that a trade-
off is required between EUT test volume and cell bandwidth, i.e., the larger the EUT test volume, the lower
the maximum test frequency. Also the EUT dimensions should not exceed 1/3 the interior cell dimensions.

A.4.5 Mode-stirred reverberation chambers

Another facility for testing equipment immunity is called a mode-stirred reverberation chamber. The EUT
is exposed on all faces to power that changes as a paddle wheel inside the test chamber is either rotated or
positioned (stepped). The paddle wheel distributes the energy in much the same way as a microwave oven
stirrer. The distribution of power illuminating the EUT is independent of EUT orientation or location,
assuming the EUT is placed at least 0.5 m away from the nearest wall within the test chamber. Note that the
test chamber can be a standard shielded enclosure with all lossy material such as the false floor removed to
improve the chambers quality factor (Q). Immunity is determined in terms of an equivalent plane wave
power density, or equivalent average field strength that may require some change of immunity limits. The
correlation between electronics degradation caused by a launched electric field in free space and a test field
launched in a reverberation chamber is related to the directivity or free space gain characteristics of the
EUT. The factor by which the reverberation chamber indicates the EUT is more immune than the free
space technique is in proportion to the EUT free space gain.

A.4.6 Fully anechoic rooms (FARs)

Another test facility gaining some prominence is a shielded room that replicates free space conditions by
placing RF absorbing material on all six surfaces of the shielded room. The advantage is that for immunity
testing the field applied to the volume occupied by the EUT is not perturbed by any undesired reflected
signals from the walls, ceiling, or floor. Hence the applied immunity signal launched at the EUT is well
controlled. A possible disadvantage, especially for floor-standing EUTs, is that any RF reference these
EUTs would have to a ground plane is in fact not possible as the EUT is on top of the floor absorbing
material in these rooms.

A.4.7 Summary of radiated immunity test facilities

A universal method for assessing electronic product RF radiated immunity is not available to meet
everyones needs. The size and extent of the electronics dictates the use of some test facilities for system
testing, while the need for accuracy of the applied field dictates the use of others. Hence, a composite of
several test facilities, each used where it is most accurate and meaningful, may be necessary to fully
characterize the immunity of the EUT.

A.5 Immunity compliance criteria

A.5.1 General

Before immunity of an EUT can be evaluated, an immunity compliance criterion must be established. This
is usually expressed in terms of the performance degradation allowed during an immunity test, which can
be specified by a standard or by an agreement between purchaser and manufacturer. Product standards
often specify product-specific immunity compliance criteria. Several classifications of degrees of
performance degradation are as follows:
a) No degradation: Equipment complies with its design specifications. This type of criteria should
be adopted for sensitive health and safety equipment, as well as services with impact on large
populations of consumers. It might conceivably be required for some critical processes or
equipment operation as well.

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b) Noticeable degradation: In this case, the EM environment has affected the performance. For
example, the degradation can cause increased noise in video and audio circuits, decreased
signal-to-noise in control circuits, error rates approaching an allowable system maximum, or
annoying audio or visual interference. While not debilitating, electromagnetic disturbance levels
just below or at this level might be used to specify the mass-produced consumer electronics
immunity level. No operator intervention should be required to continue use of the electronic
product/equipment.
c) Serious degradation: Operator intervention is required to restore specific operation of electronic
product/equipment. Examples may be system lockups, resets, indiscriminate writing on floppy
disks, and other altering of data memory. In this category, the electronics equipment will not be
able to provide continuous satisfactory operation, and it is almost certain to create situations
where customer complaints are common. To correct this, field engineering or customer service
representatives will spend considerable time in the field trying to identify and correct the
problem. Customer pressure will be felt probably at the local level. This immunity level should
be set such that this occurs on very rare occasions.
d) Failure/total inoperability: This is the most serious category, where the electronic product
totally fails and cannot be reset to regain operability. Eventually, mechanical damage could
occur. This situation is obviously totally unsatisfactory. No field repair can be accomplished.
This creates a need for complete equipment replacement with a crash design job to increase its
EMI immunity. Customer service could be interrupted for an indefinite time, dependent on the
capability of the manufacturer to produce a satisfactory replacement product. Customer
complaints would probably reach all levels of management and even public media.

A.5.2 Survey of specific degradation criteria

A.5.1 presented examples of the classifications of performance degradation. This subclause presents
specifications and classification of performance degradation from other standards.

A.5.2.1 MIL-STD-461E

MIL-STD-461E requires that the threshold of susceptibility be determined. Subclause 4.3.10.4.3 of


MIL-STD-461E specifies the following:

When susceptibility is detected, reduce the interference signal until the EUT recovers. Reduce the
interference level by an additional 6 dB. Gradually increase the interference signal until the susceptibility
condition reoccurs. The resulting level is the threshold of susceptibility. Record this level, frequency range
of occurrence, frequency and level of greatest susceptibility, and other test parameters, as applicable.

A.5.2.2 MDS-201-0004

The FDA document MDS-201-0004 at subclause 5.4 gives two definitions that can provide guidance
in setting degradation criteria. They are as follows:
a) Insignificant MalfunctionAny manifestation of inoperability or degradation of performance
that does not adversely affect the safety of the device and does not diminish the effectiveness in
its intended use; and
b) Susceptibility Degradation CriteriaA delineation of the essential safety and performance
characteristics of a medical device and the allowed degradation of those characteristics during
susceptibility testing.

A.5.2.3 RTCA DO-160E

The RTCA Inc. (http://www.rtca.org/) document requires three levels of severity of test depending upon the
use of the equipment and that the equipment exhibits no noticeable degradation at the specified stress level.
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A.5.2.4 Degradation for analog and digital home entertainment equipment

The EIA has identified several types of performance degradation to home entertainment products. They are
indicated in the subclauses that follow.

A.5.2.4.1 Analog signals (noticeable degradation)

Criteria can be established for defining satisfactory performance of a transmission channel or equipment in
the presence of impairments; however, they will result in a statistical definition as the perception of the
impairments varies considerably from one individual to the next. Use of just perceptible interference
provides repeatable measurements, because results are not significantly biased by the observer/auditor. Use
of just perceptible interference is therefore preferred. Examples of statistical definitions of acceptable or
satisfactory performance in the presence of impairments follow for use as circumstances dictate.

a) Television (Noticeable and Just Perceptible Degradation) is the ratio of desired/undesired


signals for just perceptible interference varies from about 0 dB to 57 dB, depending on the
nature of the impairment.
b) Audio (Noticeable Degradation) is the ratio for just perceptible interference varies from about
20 dB (correlated stereo) to 60 dB, depending on the nature of the impairment.

A.5.2.4.2 Digital signals

The effect of impairments on digital signals or transmissions must of necessity be defined statistically.

Data Channel (Noticeable Degradation) is a bit error rate (BER) of 103 is considered representative of the
limit acceptable service for broadcast teletext. However, under a number of impairment conditions BER
values may be inconsistent with system performance. The resulting readings become sufficiently unstable
and unrepeatable as to make the test outcome questionable.

A.5.3 Degradation for automotive electronics

The International Standards Organization (ISO) Technical Committee (TC) 22, Subcommittee 3, Working
Group 3 has written a classification scheme of failure mode severity for future inclusion in ISO 7637-1. 13

A.5.4 Classification of functional status

The following are the four classes identified:


a) Status I: The function performs as designed during and after the test.
b) Status II: The function does not perform as designed during the test but returns automatically to
normal operation after the test.
c) Status III: The function does not perform as designed during the test and does not return to
normal operation without a simple driver/passenger intervention such as turning off/on the DUT
or cycling the ignition switch after the disturbance is removed.
d) Status IV: The function does not perform as designed during and after the test and cannot be
returned to proper operation without more extensive intervention such as disconnecting and
reconnecting the battery or power feed. The function shall not have sustained any permanent
damage as a result of the testing.

13
ISO 7637-1:2002, Road vehiclesElectrical disturbances from conduction and couplingPart 1: Definitions and general
considerations.

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A.6 Other performance degradation concepts

In some cases, the description of performance degradation recording is incomplete. For these cases, a
general technique is to record the frequencies and field levels at which degradation is observed at or below
a specified tolerance or limit. Some examples of general degradation may be as follows:
a) Greater than 10 % change in an analog voltage output.
b) Change in state of digital output.
c) Error rate greater than 1 bit in a data stream.
d) Greater than 6 dB change in aural output.
Any deviation criterion other than described above may be used provided the criterion is clearly stated. For
example, the criterion might be that the EUT meets performance/data sheet specifications within
manufacturing tolerance.

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Annex B

(informative)

Recommended test equipment for measurement methods where

measurement procedure is in a referenced document

B.1 Test equipment recommended for method CI-1: power-line immunity

a) Audio isolation transformer (two required)


1) Primary impedance: 5 or less
2) Secondary impedance: 1/4 of the primary impedance (1.25 or less)
3) Frequency response: 30 Hz to 150 kHz
4) Audio power rating: 100 W
5) Secondary saturation: 50 A ac or dc maximum
6) Turns ratio: two-to-one step down with an additional identical secondary winding for
connection of a voltmeter
b) Function generator (waveforms: sine, triangular square, as required)
1) Primary impedance: 5 or less
2) Frequency accuracy: 3 %
3) Output: 0 V to 10 V (or sufficient to develop test voltage)
c) Audio amplifier
1) Frequency range: 30 Hz to 150 kHz
2) Power rating: 100
3) Output impedance: 2
d) EMI receiver (or spectrum analyzer)
1) Frequency range: 30 Hz to 150 kHz
2) Input impedance: 50
3) Amplitude accuracy: 1.5 dB
4) Bandwidth: sufficiently narrow to track injected signal
5) Voltage range: 0.1 V to 1 V

B.2 Test equipment recommended for method CI-2: power-line and signal-line
immunity, bulk current injection

a) Measurement receivers
b) Current injection probes
c) Current measurement probes

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d) Calibration fixture: coaxial transmission line with 50 characteristic impedance, coaxial


connections on both ends, and space for an injection probe around the center conductor
e) Directional coupler
f) Signal generator
g) Plotter
h) Attenuators, 50
i) Coaxial loads, 50
j) Power amplifiers
k) LISNs

B.3 Test equipment recommended for CI-4: receiver antenna input immunity for
TVs and VCRs

Use the equipment recommended in ANSI/EIA 544 and/or CEA-31.

B.4 Test equipment recommended for method CI-5: power-line surge voltage test
(IEC 61000-4-5)

Combination wave generatoropen circuit/short-circuit specifications


a) Open-circuit output voltage: 500 V to at least 4 kV
1) Waveform parametersfront time: 1.2 ms
2) Waveform parameterstime to half value: 50 ms
3) Tolerance of open-circuit output voltage: 10 %
b) Short-circuit output current: 250 A to at least 2 kA
1) Waveform parametersfront time: 8 ms
2) Waveform parameterstime to half value: 20 ms
3) Tolerance of short-circuit output current: 10 %
c) Polarity: positive and negative
d) Phase shifting: 0 degrees to 360 degrees
e) Repetition rate: at least one per minute
f) Coupling/decoupling networks (CDNs)see IEC 61000-4-5 for details

B.5 Test equipment recommended for method CI-6: electrical fast transient test
(IEC 61000-4-4)

The characteristics of the fast transient/burst generator are the following:


a) Output voltage range with 1000 load shall be at least 0.25 kV to 4 kV
b) Output voltage range with 50 load shall be at least 0.125 kV to 2 kV. The generator shall be
capable of operating under short-circuit conditions.
c) Polarity: positive/negative
d) Output type: coaxial, 50
e) DC blocking capacitor 10 nF 20 %

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f) Repetition frequency: (see Table 2) 20 %


g) Relation to power supply: asynchronous
h) Burst duration: 15 ms 20 % at 5 kHz, 0.75 ms 20 % at 100 kHz
i) Burst period: 300 ms 20 %
j) Wave shape of the pulse
1) Into a 50 load
i) Rise time tr = 5 ns 30 %
ii) Duration td (to 50 %) = 50 ns 30 %
iii) Peak voltage = according to Table B.1, 10 %
2) Into a 1000 load
i) Rise time tr = 5 ns 30 %
ii) Duration td (to 50 %) = 50 ns with a tolerance of 15 ns to +100 ns
iii) Peak voltage = according to Table B.1, 20 %
3) Coupling/decoupling networks (CDNs)See IEC 61000-4-4 for details.

Table B.1EFT peak voltages


Set voltage Vp (open Vp (1000 ) Vp (50 ) Repetition
kV circuit) kV kV frequency
kV kHz

0.25 0.25 0.24 0.125 5 or 100


0.5 0.5 0.48 0.25 5 or 100
1 1 0.95 0.5 5 or 100
2 2 1.9 1 5 or 100
4 4 3.8 2 5 or 100

B.6 Test equipment recommended for method CI-8: telecommunications


equipment with an acoustic output, 150 kHz to 30 MHz

a) Signal source (including amplifier)


1) Frequency range: 150 kHz to 30 MHz
2) Frequency accuracy: 1 %
3) Output voltage range: 0 V to 10 V
4) Harmonic and spurious signal: greater than 30 dB down
5) Modulation characteristics: AM, CW
b) LISN
1) T-LISN per IEC specifications
2) LISN per FCC/ANSI specifications
c) Preamplifier
d) Selective voltmeter
e) Artificial ear or acoustic tube

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B.7 Test equipment recommended for method RI-1: magnetic field immunity,
Helmholtz coil

a) Helmholtz coil
1) Diameter: 2.9 times the longest dimension of EUT or greater (or as determined from
Bronaugh 1990) 14
2) Coil spacing: equal to radius
3) Self-resonance: greater than 100 kHz
b) Function generator (waveforms: sine, triangular, or square, as required)
1) Frequency range: 30 Hz to 100 kHz
2) Frequency accuracy: 3 %
3) Output: 0 V to 3 V
c) Audio amplifier
1) Frequency range: 30 Hz to 100 kHz
2) Power output: 100 W
3) Output impedance: 2
d) Non-inductive resistor
1) Resistance: 1
2) Tolerance: 1 %
3) Power handling: 100 W
e) AC voltmeter
1) Input impedance: 100 k or greater
2) Frequency range: 20 Hz to 100 kHz
3) Voltage range: 0.001 V to 5 V
f) Current probe
1) Frequency range: 30 Hz to 100 kHz
2) Current range: 0 A to greater than 10 A
3) Transfer impedance: 0.33
4) Sensitivity under rated load: 0.33 mA with a 1 mV sensitivity receiver and 0.33 transfer
impedance
5) Window size (center opening): 3.2 cm (1.25 in) diameter
g) EMI Receiver (or spectrum analyzer)
1) Frequency range: 30 Hz to 100 kHz
2) Input impedance: 50
3) Amplitude accuracy: 1.5 dB
4) Bandwidth: 5 Hz to 5 kHz and 30 Hz to 100 kHz

14
E. L. Bronaugh, Helmholtz coils for EMI immunity testing: stretching the uniform field area, IEE Seventh International
Conference on Electromagnetic Compatibility, York, UK, pp. 169-172, 1990.

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5) Voltage range: 0.1 mV to 1 V


h) Magnetic field probe
1) Diameter: 13.3 cm
2) Number of turns: 36
3) Wire: 9 strands of 41 AWG wire (0.11 mm diameter)
4) Shielding: electro-statically shielded
5) Transfer impedance: to be calibrated (from volts across 50 to dBpT)

B.8 Test equipment recommended for method RI-2: magnetic field immunity, point
source

a) Function generator or audio oscillator (waveforms: sine, triangular, or square, as required)


1) Frequency range: 30 Hz to 30 kHz
2) Frequency accuracy: 3 %
3) Output: 0 V to 3 V
b) Audio amplifier
1) Frequency range: 30 Hz to 30 kHz
2) Power output: 100 W
3) Output impedance: 2
c) Non-inductive resistor (used as current shunt)
1) Resistance: 1
2) Tolerance: 1 %
3) Power handling: 100 W
d) AC voltmeter
1) Input impedance: 100 k or greater
2) Frequency range: 20 Hz to 30 kHz
3) Voltage range: 0.001 V to 5 V
e) Magnetic radiating loop (as shown in MIL-STD-461E)
f) Current probe
1) Frequency range: 30 Hz to 30 kHz
2) Current range: 0 A to greater than 10 A
3) Transfer impedance: 0.33
4) Sensitivity under rated load: 0.33 mA with a 0.1 mV sensitivity receiver and 0.33
transfer impedance
5) Window size (center opening): 3.2 cm (1.25 in) diameter
g) EMI Receiver
1) Frequency range: 30 Hz to 30 kHz
2) Input impedance: 50

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3) Amplitude accuracy: 1.5 dB


4) Bandwidth: 5 Hz to 5 kHz, 50 Hz to 30 kHz
5) Voltage range: 0.1 mV to 10 V
h) Radiating loop
1) Diameter: 12 cm
2) Number of turns: 10 to 20
3) Wire: No. 12 insulated copper
4) Magnetic flux density per A of applied current: 9.5 105 T at a distance of 5 cm from the
plane of the loop
i) Loop sensor
1) Diameter: 13.3 cm
2) Number of turns: 36
3) Wire: 7-41 Litz (7 strand, No. 41 AWG)

B.9 Test equipment and other considerations recommended for method RI-5:
electric field immunity, 10 kHz to 80 MHz (TEM cell method per NBS TN 1013)

This test is derived from an earlier version of NBS TN 1013.

B.9.1 Test equipment

a) Signal source
1) Frequency: 10 kHz to 80 MHz
2) Frequency accuracy: 1 %
3) Output voltage range: 0 V to 1 V
4) Harmonic and spurious signal: more than 30 dB down from fundamental
5) Modulation characteristics: FM CW, AM to 1 GHz, pulse above 200 MHz
b) TEM transmission cell
1) Frequency range: 10 kHz to 80 MHz
2) Septum (center conductor) width: 127 cm (54 in)
3) Access door size: 72.6 cm 45.72 cm (30 in 18 in)
4) Maximum test sample size: 58.42 cm 58.42 cm 20.32 cm (23 in 23 in 8 in)
5) Maximum test sample weight: 91 kg (200 lb)
6) TEM cell size inside dimensions: 360.6 cm 185.42 cm 129.54 cm (142 in 73 in
51 in). See NOTE 1 of B.9.2.
c) RF voltmeter with coaxial tee-junction connector
1) Frequency range: 10 kHz to 80 MHz
2) Voltage accuracy: 3 %
3) Input impedance when used with coaxial tee-junction: 10 k or greater
4) VSWR of coaxial tee-junction: not to exceed 1.1:1, maximum

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5) Input impedance when used with 50 adapter: 50


d) RF power amplifier
1) Frequency range: 10 kHz to 80 MHz
2) Power output: 100 W into 50
3) Output impedance: 50
4) Input impedance: 50
5) Gain: greater than 40 dB
6) Harmonic distortion: more than 25 dB below fundamental when operating at 80 % power
rating
7) Amplitude/output gain-flatness: 1.5 dB
e) Coaxial load
1) Impedance: 50
2) Power rating: 100 W
3) VSWR: 1.1:1 maximum
f) Low-pass filter
1) Cutoff frequency (fc): as needed to suppress generator harmonics and spurious emissions up
to 80 MHz
2) Power rating: 100 W
3) Impedance: 50
4) Insertion loss in pass band: 0.3 dB maximum
5) Pass-band VSWR: 1.25:1 maximum
6) Attenuation: 60 dB at 1.5 fc
g) Dual-directional coupler
1) Frequency range: 30 MHz to 80 MHz
2) Power rating: 100 W
3) Coupling factor: 50 dB 1 dB
4) Directivity: 25 dB
5) Insertion loss: 0.15 dB maximum
6) Impedance: main line 50
7) VSWR: 1.2:1 maximum
h) Power meter (two required)
1) Range: 10 mW to 10 W
2) Frequency range: 30 MHz to 80 MHz. For pulse signals, peak-reading power meters are
required

B.9.2 Summary for TEM cell method

The TEM cell method can be used to accurately generate absolute test fields when the EUT does not
occupy an excessive portion of the test volume. It is especially useful for diagnostic testing, for example, to

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determine frequencies of EUT susceptibility, to give some indication of how interference is coupled into
the EUT, and to assess the relative improvement in the EUT immunity resulting from efforts to reduce EUT
susceptibility. It cannot be used to determine EUT immunity to absolute test fields if the EUT includes long
wire harnesses that must be exposed or polarization matched to the test field; only relative tests can be
performed for this situation.

NOTE 1Detailed considerations concerning EUT size, frequency limitations, and construction specifications are
given in NBS TN 1013. In general the EUT should be less than 1/3 the length (L), width (2a), and separation distance
between the cell septum (center conductor) and floor (b). Test samples of any size could be tested using a TEM cell
modeled from the dimensions above as long as the EUT size versus the TEM cell size constraints prevent excessive
impedance loading and test-field perturbation when inserting the EUT into the cell. Thus, a small EUT could be tested
at higher frequencies in a smaller cell, and a large EUT could be tested at lower frequencies in a larger cell. The
procedure for testing is the same for all sizes of cells except when using larger cells to obtain the same test field levels;
then higher power signal sources and appropriate high-power terminations (50 ) are required.

NOTE 2The upper useful frequency for a TEM cell is limited by the distortion of the test signal caused by multi-
modes and resonances that occur within the cell at frequencies above those listed for the test method and TEM cell
example dimensions. The dimensions for cells suggested for use in the frequency range of 10 kHz through 80 MHz are
given in item b) of B.9.1. The frequencies of resonances f resmn associated with these modes can be found from Equation
(B.1):

2
c
f res = f c2 + (B.1)
2l

where
c = the wave propagation velocity (3.0 108 m/s)
l = the resonant length of the cell

NOTE 3The length of the cell for calculating the resonance of a particular mode is a function of how that mode is
launched inside the cell. Some modes will exhibit waveguide below cut-off characteristics in the cells tapered
transitions and hence are attenuated rapidly in the transitions while other modes, particularly those associated with the
gap between the septum and sidewall, can propagate the full length of the cell. Thus, the recommended upper
frequencies exceed the multimode cutoff frequency of the first higher order mode (TE01) but are less than this modes
resonant frequency.

NOTE 4The useful upper frequency for the cell is reduced 10 % to 20 % from the cutoff-multimode resonant
frequency given in Equation (B.1) to account for the loading effect of the EUT.

Because the cell operates with the fundamental TEM mode, broadband CW testing with amplitude or
frequency modulation is possible. In addition, the cell can be used to establish impulsive waveforms for
testing by using an appropriate waveform generator connected to the cell input port, assuming the
frequency content of the waveform does not exceed the multimode cutoff frequency of the cell.

B.10 Test equipment recommended for RI-6: electric field immunity, 80 MHz to
10 GHz (IEC 61000-4-3)

Following is a list of required equipment. Table B.2 and Table B.3 provide guidance on power
requirements to attain the desired fields.
a) Signal source
1) Frequency range: 10 kHz to 10 GHz
2) Output power: 0 mW to 10 mW

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3) Output impedance: 50
4) Gain: greater than 40 dB
5) Harmonic distortion: more than 25 dB below fundamental when operating at 80 % power
rating
6) Output gain/amplitude flatness: 1.5 dB
b) EMI receiver (as specified in ANSI C63.2)
c) RF power attenuator
1) Frequency range: 80 MHz to 10 GHz
2) Attenuation: as required to prevent the RF power going into the EMI receiver from
exceeding 1 mW peak
3) Impedance: 50
4) Amplifier RF power rating: 20 W average
5) VSWR: 1.2:1 maximum
d) Test enclosure
1) Size: large enough to accept test sample and antennas that will be positioned no closer than
1 m to the shielded enclosure surface or absorber material.
2) Shielding effectiveness: to ensure cost effectiveness, the shielding requirements of the
enclosure should be determined on a case-by-case basis depending on the level of immunity
electric field. (See IEEE Std 299.)
3) Power-line filtering: Should provide at least 80 dB of insertion loss over the frequency
range.
4) RF-absorber material: Sufficient material should be applied to surfaces of chamber to meet
uniform field deviation criteria of 0 dB to +6 dB.
e) Directional coupler
1) Frequency range: 80 MHz to 10 GHz
2) Nominal coupling: 10 dB
3) Maximum coupling variation: 0.5 dB
4) Impedance: 50

Table B.2Guidance for obtaining the desired field as function of the amplifier power
(in W) for a biconical dipole antenna as radiator, 1 m separation from EUT
Field strength
V/m
Frequency
MHz 1 5 10 20
Amplifier power
W
80 0.09 2.3 9.3 37.2
100 0.09 2.3 9.2 36.7
160 0.09 2.1 8.6 34.4
200 0.07 1.8 7.3 29.4
240 0.08 2.0 8.0 32.0
280 0.09 2.2 8.6 34.6
300 0.09 2.2 8.8 35.3

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Table B.3Guidance for obtaining the desired field as function of the amplifier power
(in W) for a double ridge horn antenna as radiator, 1 m separation from EUT
Field strength
V/m
Frequency 1 5 10 20
MHz
Amplifier power
W
200 0.011 0.28 1.1 4.5
400 0.004 0.11 0.44 1.8
600 0.005 0.13 0.53 2.2
800 0.004 0.10 0.40 1.6
1000 0.007 0.18 0.71 2.8

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