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8/16/32GB 27nm eMMC parts are now available to sample (CS type)! Please input sample requests for all
customers using old generations of moviNAND now. We'll expedite for ASAP delivery.
SEC will ramp 27nm production quickly so it is imperative that all customers get qualified ASAP.
Please work closely with FAE and SSI Marketing should there be any issues with converting to 27nm.
Thank you!
• Updated datasheet:
Best regards,
Tuoi
Notice: Unless specifically identified as a firm offer or an offer to sell, this message is not an offer of sale. Any terms stated in this message
or prices quoted are merely indications of terms on which Samsung Semiconductor, Inc. may consider selling, and are not intended to be
binding.
Rev. 1.0, Sep. 2010
KLMXGXFEJA
datasheet
SAMSUNG ELECTRONICS RESERVES THE RIGHT TO CHANGE PRODUCTS, INFORMATION AND
SPECIFICATIONS WITHOUT NOTICE.
Products and specifications discussed herein are for reference purposes only. All information discussed
herein is provided on an "AS IS" basis, without warranties of any kind.
This document and all information discussed herein remain the sole and exclusive property of Samsung
Electronics. No license of any patent, copyright, mask work, trademark or any other intellectual property
right is granted by one party to the other party under this document, by implication, estoppel or other-
wise.
Samsung products are not intended for use in life support, critical care, medical, safety equipment, or
similar applications where product failure could result in loss of life or personal or physical harm, or any
military or defense application, or any governmental procurement to which special terms or provisions
may apply.
For updates or additional information about Samsung products, contact your nearest Samsung office.
All brand names, trademarks and registered trademarks belong to their respective owners.
-1-
Rev. 1.0
0.5 1.Smart Report in chapter 5.2 is changed. Aug. 20, 2010 Advance S.M.Lee
2.Active Current in Chapter 8.1 is changed.
3.Standby Current in Chapter 8.2 is changed.
4.Sleep Current in Chapter 8.3 is changed.
5.Errata are corrected.
6.Write Timeout is changed in Chapter 7.1
7.8GB, 32GB, 64GB products are added
-2-
Rev. 1.0
-3-
Rev. 1.0
The SAMSUNG moviNAND is an embedded MMC solution designed in a BGA package form. moviNAND operation is identical to a MMC card and there-
fore is a simple read and write to memory using MMC protocol v4.41 which is a industry standard.
moviNAND consists of NAND flash and a MMC controller. 3V supply voltage is required for the NAND area (VDDF) whereas 1.8V or 3V dual supply volt-
age (VDD) is supported for the MMC controller. Maximum MMC interface frequency of 52MHz and maximum bus widths of 8 bit are supported.
There are several advantages of using moviNAND. It is easy to use as the MMC interface allows easy integration with any microprocessor with MMC
host. Any revision or amendment of NAND is invisible to the host as the embedded MMC controller insulates NAND technology from the host. This leads
to faster product development as well as faster times to market.
The embedded flash mangement software or FTL(Flash Transition Layer) of moviNAND manages Wear Leveling, Bad Block Management and ECC. The
FTL supports all features of the Samsung NAND flash and achieves optimal performance.
• SAMSUNG moviNAND supports below special features which are being discussed in JEDEC
• Full backward compatibility with previous MultiMediaCard system ( 1bit data bus, multi-moviNAND systems)
• Power : Interface power --> VDD (1.70V ~ 1.95V or 2.7V ~ 3.6V) , Memory power --> VDDF(2.7V ~ 3.6V)
-5-
Rev. 1.0
C
K2 VDDI Y4 VDD DNU DNU DNU DNU
H3 DAT0 N5 VDDF G
H4 DAT1 U8 Vss
H DAT0 DAT1 DAT2 RFU RFU
H5 DAT2 M7 Vss
J DAT3 DAT4 DAT5 DAT6 DAT7
J2 DAT3 AA6 Vss
K V DDI Vss RFU VDD
J3 DAT4 P5 Vss
J4 DAT5 Y5 Vss L
H7 RFU U5 RSTN
R RFU Vss
K5 RFU
T RFU VDDF
M5 RFU
U RSTN RFU RFU Vss VDDF RFU
M8 RFU
M9 RFU V
P10 RFU
AB
R5 RFU
DNU DNU
AC DNU DNU
T5 RFU
AD
U6 RFU DNU DNU DNU DNU
U7 RFU AE
DNU DNU DNU DNU
U10 RFU AF
DNU DNU DNU DNU
AA7 RFU AG
AA10 RFU DNU DNU
AH DNU DNU
Figure 1. 169-FBGA
-6-
Rev. 1.0
A
B
#A1 C
D
E
F
G
H
J
0.50
(Datum B) K
L
0.50 x 13 = 6.50
0.25
M
16.00±0.10 N
16.00±0.10
16.00±0.10
P
R
T
U
V
5.25
W
6.25
Y
6.75
AA
AB 0.50
AC
AD
AE 0.25
AF
AG
AH
0.22±0.05 0.75
1.10±0.10
1.75
169-∅0.30±0.05 2.75
∅ 0.2 M A B
3.25
-7-
Rev. 1.0
A
B
#A1 C
D
E
F
G
H
J
0.50
(Datum B) K
L
0.50 x 13 = 6.50
0.25
M
16.00±0.10 N
16.00±0.10
16.00±0.10
P
R
T
U
V
5.25
W
6.25
Y
6.75
AA
AB 0.50
AC
AD
AE 0.25
AF
AG
AH
0.22±0.05 0.75
1.30±0.10
1.75
169-∅0.30±0.05 2.75
∅ 0.2 M A B
3.25
-8-
Rev. 1.0
14.00±0.10
A
0.50 x 13 = 6.50 #A1 INDEX MARK
3.25
0.08 MAX 0.50 0.25
14.00±0.10
B
1413121110 9 8 7 6 5 4 3 2 1
(Datum B)
A
B
#A1 C
D
E
F
G
6.75
H
J
K
L
0.50 x 27 = 13.50
M
0.25
18.00±0.10
18.00±0.10
N
18.00±0.10
P
R
T
U
V
W
Y
AA
AB
AC
AD
0.25
AE
AF
AG
AH
0.22±0.05
0.09±0.10 169-∅ 0.300±0.05 (Datum A)
∅ 0.2 M A B
-9-
Rev. 1.0
A
B
#A1 C
D
E
F
G
H
J
0.50
(Datum B) K
L
0.50 x 13 = 6.50
0.25
M
18.00±0.10 N
18.00±0.10
18.00±0.10
P
R
T
U
V
5.25
W
6.25
Y
6.75
AA
AB 0.50
AC
AD
AE 0.25
AF
AG
AH
0.22±0.05 0.75
1.30±0.10
1.75
169-∅0.30±0.05 2.75
∅ 0.2 M A B
3.25
- 10 -
Rev. 1.0
VDDF
VDD
- 11 -
Rev. 1.0
This reliability setting only impacts the reliability of the main user area and the general purpose partitions.
- 12 -
Rev. 1.0
The block size defined by SET_BLOCKLEN (CMD16) is ignored and reliable write is executed as only 512 byte length. There is no limit on the size of the
reliable write.
Area marked by Secure Trim Step1 is shown as EXT_CSD[181](ERASED_MEM_CONT) before Secure Trim Step2 is completed.
When Secure Trim Step2 is issued, if there is no data marked by Secure Trim Step1, Secure Trim Step2 does not work.
- 13 -
Rev. 1.0
- 14 -
Rev. 1.0
Fields Definitions
Background Operation Check CMD8 Or Card Status Register If BKOPS_STATUS is not 0 or 6th bit of card status register is set, there
are something to be performed by background operation
- 15 -
Rev. 1.0
Fields Descriptions
- 16 -
Rev. 1.0
The User Data Area can be divided into four General Purpose Area Partitions and User Data Area partition. Each of the General Purpose Area partitions
and a section of User Data Area partition can be configured as enhanced partition.
Boot Partition size & RPMB Partition Size are set by the following command sequence at same time:
Boot Partition size & RPMB Partition Size are set by the following command sequence at same time:
If the failure is in data programming case, the data is not programmed. And if the failure occurs in data read case, the read data is ‘0x00’.
Max Enhanced User Data Area size is defined as (MAX_ENH_SIZE_MULT x HC_WP_GRP_SIZE x HC_ERASE_GPR_SIZE x 512kBytes)
- 17 -
Rev. 1.0
USER_WP (EXT_CSD[171]) register allows the host to apply write protection to all the partitions in the user area.
The host has the ability to check the write protection status of segments by using the SEND_WRITE_PROT_TYPE command (CMD31). When full card
protection is enabled all the segments will be shown as having permanent protection.
An attempt to set both the disable and enable bit for a given protection mode (permanent or power-on) in a single switch command will have no impact
and switch error occurs.
Setting both B_PERM_WP_EN and B_PWR_WP_EN will result in the boot area being permanently protected.
- 18 -
Rev. 1.0
CLK
DAT[0] 512bytes
S 010 E S +CRC E
Boot terminated
(1) (3)
MIn 8 cloks + 48 clocks = 56 clocks required from
CMD signal high to next MMC command.
(2)
*(1) Boot ACK Time (2) Boot Data Time (3) CMD1 Time
CLK
DAT[0] S 512bytes
E
S 010 E +CRC
(3)
Min74
Clocks (1) Boot terminated
required
after
power is (2)
stable to
start boot
command
*(1) Boot ACK Time (2) Boot Data Time (3) CMD1 Time
*CMD0 with argument 0xFFFFFFFA
[Table 26] Boot and ack timing value and Initialization time
Timing Factor Value
(1) Boot ACK Time < 50 ms
(2) Boot Data Time < 60 ms
(3) Initialization Time* < 200ms
- 19 -
Rev. 1.0
Wear leveling means that blocks should be used evenly in order to expand life span of device. Wear leveling is executed in each partition locally because
of each partition with different attribute.
Enhanced Area
User Area
And then device reserves free block and executes wear-level at each partition respectively.
Boot Partition #1  RPMB 4 General Purpose Partitions (GPA) Enhanced User Data Area
1 2 3 4
[Table 29] Relation between Maximum Enhanced Partition Size and Total User Density
Device Max. Enhanced Partition Size
8GB 3,632 MB
16GB 7,312 MB
32GB 14,704 MB
64GB 29,408 MB
- 20 -
Rev. 1.0
At this time, commands arriving at the device while it is in power saving mode will be serviced in normal fashion
[Table 31] Comparison between Auto Power Saving Mode and Sleep Mode
Auto Power Saving Mode Sleep Mode
NAND Power ON OFF
GotoSleep Time < 1ms < 1ms
Wakeup Time < 500ns TBD
Mode Contents
1. Detect Error Mode
2. Detect Super Block Size
3. Detect Super Page Size
4. Detect Optimal Write Size
5. Detect Number Of Banks
6. The number of Initial Bad Block, Per Bank
7. The number of Run Time Bad Block, Per Bank
Customer Report
8. Number of remain block in Reserved Block
9. Max, Min, Avg Erase Count
10. Number of read reclaim
11. Detect Optimal Trim Size
12. Hash code
13. Max, Min, Avg Erase Count (SLC)
14. Max, Min, Avg Erase Count (MLC)
- 21 -
Rev. 1.0
5.2.3 Performance
Density Sequential Read (MB/s) Sequential Write (MB/s)
8GB
16GB
40 20
32GB
64GB
* Test/ Estimantion Condition : Bus width x8, 52MHz, 4MB data transfer, w/o file system overhead
- 22 -
Rev. 1.0
- 23 -
Rev. 1.0
- 24 -
Rev. 1.0
R : Read only
W: One time programmable and not readable.
R/W: One time programmable and readable.
W/E : Multiple writable with value kept after power failure, H/W reset assertion and any CMD0 reset and not readable.
R/W/E: Multiple writable with value kept after power failure, H/W reset assertion and any CMD0 reset and readable.
R/W/C_P: Writable after value cleared by power failure and HW/ rest assertion (the value not cleared by CMD0 reset) and readable.
R/W/E_P: Multiple writable with value reset after power failure, H/W reset assertion and any CMD0 reset and readable.
W/E/_P: Multiple wtitable with value reset after power failure, H/W reset assertion and any CMD0 reset and not readable
Reserved1 7 [511:505] -
Supported Command Sets S_CMD_SET 1 R [504] 0x1
HPI features HPI_FEATURES 1 R [503] 0x3
Background operations support BKOPS_SUPPORT 1 R [502] 0x1
1 255 TBD [501:247] -
Reserved
Background operations status BKOPS_STATUS 1 R [246] 0
CORRECTLY_PRG_SECTOR
Number of crrectly programmed sectors 4 R [245:242] 0
S_NUM
I st initialization time after partitioning IN_TIMEOUT_AP 1 R [241] 0xA
1 1 TBD [240] -
Reserved
Power class for 52MHz, DDR at 3.6V PWR_CL_DDR_52_360 1 R [239] 0
Power class for 52MHz, DDR at 1.95V PWR_CL_DDR_52_195 1 R [238] 0
- 25 -
Rev. 1.0
Reserved1 1 [211] -
Minimum Write Performance for 8bit @52MHz MIN_PERF_W_8_52 1 R [210] 0
Minimum Read Performance for 8bit @52MHz MIN_PERF_R_8_52 1 R [209] 0
Minimum Write Performance for 8bit @26MHz /
MIN_PERF_W_8_26_4_52 1 R [208] 0
4bit @52MHz
Minimum Read Performance for 8bit @26MHz /
MIN_PERF_R_8_26_4_52 1 R [207] 0
4bit @52MHz
Minimum Write Performance for 4bit @26MHz MIN_PERF_W_4_26 1 R [206] 0
Minimum Read Performance for 4bit @26MHz MIN_PERF_R_4_26 1 R [205] 0
1 1 [204] -
Reserved
Power Class for 26MHz @ 3.6V PWR_CL_26_360 1 R [203] 0
Power Class for 52MHz @ 3.6V PWR_CL_52_360 1 R [202] 0
Power Class for 26MHz @ 1.95V PWR_CL_26_195 1 R [201] 0
Power Class for 52MHz @ 1.95V PWR_CL_52_195 1 R [200] 0
Partition switching timing PARTITION_SWITCH_TIME 1 R [199] 0x1
Out-of-interrupt busy timing OUT_OF_INTERRUPT_TIME 1 R [198] 0x1
1 1 [197] -
Reserved
Card Type CARD_TYPE 1 R [196] 0x7
1 1 [195] -
Reserved
CSD Structure Version CSD_STRUCTURE 1 R [194] 0x2
Reserved1 1 [193] -
Extended CSD Revision EXT_CSD_REV 1 R [192] 0x5
Modes Segment
Command Set CMD_SET 1 R/W [191] 0
1 1 [190] -
Reserved
Command Set Revision CMD_SET_REV 1 R [189] 0
Reserved1 1 [188] -
Power Class POWER_CLASS 1 R/W [187] 0
Reserved1 1 [186] -
High Speed Interface Timing HS_TIMING 1 R/W [185] 0
Reserved1 1 [184] -
Bus Width Mode BUS_WIDTH 1 W/E_P [183] 0
1 1 [182] -
Reserved
Erased Memory Content ERASED_MEM_CONT 1 R [181] 0
1 1 [180] -
Reserved
R/W/E&
Partition configurationn PARTITION_CONFIG 1 [179] 0
R/W/E_P
R/W &
Boot config proteetion BOOT_CONFIG_PRPT 1 [178] 0
R/W/C_P
Boot bus width1 BOOT_BUS_WIDTH 1 R/W/E [177] 0
1 1 TBD [176] -
Reserved
High-density erase group definition ERASE_GROUP_DEF 1 R/W/E_P [175] 0
1 1 TBD [174] -
Reserved
R/W &
Boot area write proection register BOOT_WP 1 [173] 0
R/W/C_P
- 26 -
Rev. 1.0
- 27 -
Rev. 1.0
tPP
tWH
min (VIH)
tWL
CLK 50% VDD 50% VDD
tIH max (VIL)
tTHL tTLH
tISU
min (VIH)
Input Data Invalid Data
max (VIL)
t tOSU tOH
ODLY
min (VOH)
Output Data Invalid Data
max (VOL)
- 28 -
Rev. 1.0
NOTE :
1)The card must always start with the backward-compatible interface timing mode can be switched to high-speed interface timing by the host sending the SWITCH command
(CMD6) with the argument for high-speed interface select.
2) CLK timing is measured at 50% of VDD.
3) For compatibility with cards that suport the v4.2 standard or earlier verison, host should not use>20MHz before switching to high-speed interface timing.
4) Frequency is periodically sampled and is not 100% tested.
5) CLK rise and fall times are measured by min(VIH) and max(VIL).
High-Speed Mode
Parameter Symbol Min Max Unit Remark
NOTE :
1) CLK timing is measured at 50% of VDD.
2) A MultiMediaCard shall support the full frequency range from 0-26MHz, or 0-52MHz
3) Frequency is periodically sampled and is not 100% tested.
4) Card can operate as high-speed card interface timing at 26MHz clock frequency.
5) CLK rise and fall times are measured by min(VIH) and max(VIL).6) Inputs CMD, DAT rise and fall times are measured by min(VIH) and max(VIL), and outputs CMD, DAT rise
and fall times are measured by min(VOH) and max(VOL).
- 29 -
Rev. 1.0
t
PP
min (VIH)
CLK
t t
IHddr IHddr max (VIL)
t tISUddr
ISUddr
min (VIH)
Input DATA DATA DATA Invalid
max (VIL)
t t
ODLYddr(max) ODLYddr(max)
tODLYddr(min) tODLYddr(min)
min (VOH)
Output I DATA DATA DATA
max (VOL)
In DDR mode data on DAT[7:0] lines are sampled on both edges of the clock
(not applicable for CMD line)
Figure 11. Timing diagram: data input/output in dual data rate mode
Input CLK1
Clock duty cycle 45 55 % Includes jitter, phase noise
Input DAT (referenced to CLK-DDR mode)
Input set-up time tISUddr 2.5 ns CL ≤ 20 pF
NOTE :
1) CLK timing is measuted at 50% of VDD
2) Inputs CMD, DAT rise and fall times are measured by min (VIH) and max(VIL), and outputs CMD,DATrise and fall times measured by min(VOH) and max(VOL)
- 30 -
Rev. 1.0
8.2 Standby Power Consumption in auto power saving mode and standby state.
CTRL NAND
Density NAND Type Unit
25°C(Typ) 85°C 25°C(Typ) 85°C
8GB 32Gb MLC x 2 20 100
16GB 32Gb MLC x 4 40 200
100 250 uA
32GB 32Gb MLC x 8 80 400
64GB 32Gb MLC x 16 160 800
NOTE:
Power Measurement conditions: Bus configuration =x8 @52MHz , No CLK
*Typical value is measured at Vcc=3.3V, TA=25°C. Not 100% tested.
- 31 -
Rev. 1.0
The sum of the host and bus capacitances should be under 20pF.
- 32 -
Rev. 1.0
VDD
VDD VDD
R R R R R R R R R R
50k 50k 50k 50k 50k 50k 50k 50k 50k 10k
moviNAND
R 27 Ω
CLK
CMD CLK VDD
CMD VDDF C C
2.0uF 0.2uF
DAT0
DAT1 DAT0
DAT2 DAT1
Host Controller
C
0.2uF
VDD
VDD VDD
R R R R R R
50k 50k 50k 50k 50k 10k
moviNAND
R 27 Ω
CLK
CMD CLK VDD
CMD VDDF C
C
2.0uF
DAT0 0.2uF
DAT1 DAT0
DAT2 DAT1
Host Controller
C
0.2uF
- 33 -